TS2500-RF – The First Fully Automatic Probe System Dedicated for RF Production Test

MPI Corporation has quickly become the innovation leader in our served markets by introducing more than a dozen new products in a span of less than two years.

The latest product innovation of MPI is a fully automatic probe system dedicated to Radio Frequency (RF)  production test.  The system is compatible with all MPI system accessories and is designed specifically to address the need for advanced RF device testing at the production level.

MPI-AST-V20-001

TS2500-RF Data Sheet

Features & Benefits

Thin Wafer Handling

The unique design of TS2500-RF chucks and wafer lift pins can safely handle wafers with thickness down to 50 micrometers and thus enable testing of challenging thin III-Vs compounds wafers.

The RF chucks include two auxiliary chucks constructed….

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High Throughput

Automation includes dual end-effectors combined with dual wafer cassette holders for 150 or 200mm wafers, providing high efficiency wafer exchange and enhanced speed of test. The TS2500-RF can reach maximum speed of 10 Die/second (dependent upon final systems configuration) which makes it an ideal choice for production electrical tests on discrete RF devices as well as integrated circuits (ICs).

TS2500_off-axis-wafer-alignment-camera

Advanced Alignment

Advanced alignment features such as off-axis and chuck mounted upper-looking cameras make the TS2500-RF an ideal platform for testing within complex RF measurement configurations. Decades of experience from MPI Photonics Automation Division making such features reliable.

RF measurement Test

Complete Test Solution

The TS2500-RF can be configured with MPI’s advanced RF accessories such as, RF MicroPositioners™, RF cables, calibration substrates and TITAN™ RF probes to ensure precise and accurate RF measurements.

With the integration of the VNA closer to the DUT, the….

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