Automated Probe System |  200 mm Wafer Prober |  High Power Probes |  200mm Wafer Prober |  High Power Probe Station |  High Power Production Test Measurements |  Wafer Probing Station  

Wafer Probe Stations | Wafer Prober Machine

150 mm Probe Stations | Wafer Test

300mm Probe Stations |  RF Probe Station

TS2000-HP –  Advanced High Power Solution

MPI TS2000-HP - 200 mm High Power Automated Probe System

MPI’s automated TS2000-HP provides reliable on-wafer high power device measurement over wide-temperature range and measurement capability up to 3 kV (triax) / 10 kV (coax) and 600 A (pulsed). Advanced ShielDEnvironment™ offers low-noise and shielded test environment.

It incorporates MPI advanced technologies, such as VCE™, mDrive™ and/or PHC™ optional or as an upgrade in the field.

Features & Benefits

Safety

Interlocked enabled safety light curtain to protect user from accidental high voltage shock by shutting down the instrument through interlock system.

The system has rear doors, protected by interlock as well in order to provide easy and convenient initial measurement set-up.

MPI TS2000-HP - Safety Light Curtain

ShielDEnvironment™

MPI ShielDEnvironment™ is a high performance local environmental chamber providing excellent EMI- and light-tight shielded test environment for ultra-low noise, low capacitance measurements.

To prevent arcing between chuck and platen, TS2000-HP platen is specially designed with MPI advanced ArcShield™. 

MPI ShielDEnvironment™

High Voltage, High Current and Ultra High Power Probes

MPI High Power probing solutions include the dedicated high current probes which use MPI propriety multi-contact tips for reduced contact resistance. MPl’s high voltage probes are capable of low leakage current measurements during high voltage tests up to 3 kV triaxial or 5 kV & 10 kV coaxial set-ups and up to 600 A.

MPI’s high-power probe cards suspending arcing up to 10 kV and offering unique testing possibilities up to 150°C as well.

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Optional Anti-Arcing LiquidTray™

Specially designed anti-arcing LiquidTray™ can be used for arcing suppressing by simply place on the high power chuck surface. Wafers can be safely placed inside the tray to submerge in the liquid for arcing free high voltage test.

MPI Optional Anti-Arcing LiquidTray™

Hot/Cold Wafer Swaps at Set Temperatures

The automated single wafer loader and the safety test management provide a unique capability to load/unload wafers at any chuck temperatures. Cooling down or heating up to ambient is not required anymore to load or unload a wafer. This saves major down time and increases the overall MPI Test Systems efficiency significantly. Necessary settings are protected by a convenient supervisor log-in procedure.

MPI TS2000-SE - Convenient Wafer Swap at Set Temperatures

MPI TS2000-HP shares the same standard features, such as, thermal chuck integration, Safety Test Management™, automated single wafer loader, vibration isolation, and integrated prober control of the TS2000-SE system.

Feel the Difference

Software Suite SENTIO®

MPI automated engineering probe systems are controlled by a unique and revolutionary, multi-touch operation SENTIO® Software Suite – simple and intuitive operation saves significant training time, the Scroll, Zoom, Move commands mimic modern smart mobile devices and allows everyone to become an expert in just minutes. Switching between the active application and the rest of the APPs is just matter of a simple finger sweep.

For RF applications, there is no need to switch to another software platform – the MPI RF calibration software program QAlibria® is fully integrated with SENTIO® – for ease of use by following a single operational concept methodology.

MPI Prober Control Software Suite SENTIO®
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Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com