MPI RF Calibration Substrates
![RF Calibration Substrates RF Calibration Substrates](http://www.mpi-corporation.com/wp-content/uploads/slider105/ac2-2.jpg)
![RF Calibration Substrates RF Calibration Substrates](http://www.mpi-corporation.com/wp-content/uploads/slider105/2-ac-3.jpg)
![RF Calibration Substrates RF Calibration Substrates](http://www.mpi-corporation.com/wp-content/uploads/slider105/3ba-ac-5.jpg)
MPI RF Calibration Substrates - AC2
MPI RF Calibration Substrates - AC3
MPI RF Calibration Substrates - AC5
MPI offers variety of calibration standards developed to address specific application needs of the on-wafer RF and microwave measurements.
The AC-series of calibration substrates offers up to 26 sets of standards for wafer-level SOLT, LRM probe-tip calibration for GS/SG and GSG probes.
Five coplanar lines provide the broadband reference multiline TRL calibration as well as accuracy verification of conventional methods.
Right-angled reciprocal elements are added to support the SOLR calibration of the system with the right-angled configuration of RF probes. The calibration substrate for wide-pitch probes is also available.
Slide 1