Wafer Test | Probe Systems | Probe Stations | Wafer Test | Probe Systems | Probe System | Probe Systems
vacuum probe station | Probe Stations
Manual Probe Station | Manual Probe System
Probe Stations | 200 mm Wafer Prober
MPI RF Calibration Substrates
The AC-series of calibration substrates offers up to 26 sets of standards for wafer-level SOLT, LRM probe-tip calibration for GS/SG and GSG probes.
Five coplanar lines provide the broadband reference multiline TRL calibration as well as accuracy verification of conventional methods.
Right-angled reciprocal elements are added to support the SOLR calibration of the system with the right-angled configuration of RF probes. The calibration substrate for wide-pitch probes is also available.