Silicon Photonics Test Systems

Silicon Photonics

Silicon Photonics on-wafer tests

Silicon Photonics Test

Silicon Photonics Test Systems

SiPH On-Wafer Tests

Silicon Photonics Wafer Probing

SiPH Wafer Probing

Silicon Photonics Wafer-Level Probing

Silicon Photonics Wafer-Level Testing

Silicon Photonics Wafer Probe Station

Silicon Photonics Wafer Probing

Silicon Photonics On-Wafer Test

 Silicon Photonics Wafer Testing | Silicon Photonics Test Systems | Silicon Photonics Test Solutions | Silicon Photonics Test

Silicon Photonics on-wafer Tests

Silicon Photonics Probe Systems
electrical-test wafer probing.

MPI Definition

The requirement to increase bandwidth in all phases of wire and/or wireless communications combined with an increase in data center speed is driving the communication world away from copper interconnects and towards Silicon Photonics. This evolving technology uses a combination of fiber optics, optical wave guides, integrated optics, optical amplifiers, laser frequency light waves, and photo detectors to carry far more data than traditional copper conductors, to support faster data transfer rates between data communication centers.

There are many new processes and capabilities which require to perform variety of non-conventional on-wafer measurements, such as pure parametric optical: Insertion Loss (IL), polarization dependent loss (PDL) measurements, Optical/Electrical S-Parameters, E-E, E-O, O-E, O-O, optical eye, jitter, transmitter and dispersion eye closure (TDEC), and e.g. on the receiver side bit-error-rate (BER) testing.

Major Requirements

Integration of very accurate single and/or multi-fiber array alignment systems, in combination with common electrical DC and RF signals. Probe arms with optical fiber matching the device operating wavelength and gradient coupler’s angles.

Automated and highly precise Z-sensing for keeping the fibers in constant few micrometer distance to the optical I/Os. High mechanical stability and vibration isolation control in order to minimize e.g. trans-impedance amplifier (TIA) output voltage variations.

MPI Solutions

MPI designed dedicated SiPH Upgrades for silicon photonics on-wafer tests. The systems are designed with a reduced platen to chuck distance which allows shorter overall fiber length for performing repeatable low noise measurements.

Variety of accurate up to 6-axis fiber positioning stages and related software can be easily configured with the MPI SiPH probe systems in order to meet different requirements. Easy upgrade path safes budgets and time, if requirements are changing.

Solutions for just single fiber or multi-fiber-arrays are available, all integrated with automated Z-sensing unit for constant distance of few micrometer to the optical I/O. MPI provides unique safety concept offering of an integrated crash protection to prevent not only collisions of the wafer to the fiber at initial set-up but also of both independent I/O fibers/arms.

Seamless integrated measurement rack accommodates controllers, drivers very close and convenient to operate by not consume additional floor space.


Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to