Wafer Prober

150mm Probe Stations

150mm Manual Probe Systems

200mm Probe Stations

150 mm Wafer Prober

Wafer Prober Manufacturer

Wafer Prober

Wafer Prober Machine

Wafer Probing Station

150mm Manual Probe Station

MPI PCB Probe Systems

MPI manual probe systems configured with variety of different holders

Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.

MPI’s TS150-THZ & TS200-THZ systems extend  the frequency ranges up to sub-THz range, making these the most multi-purpose manual probe stations available anywhere.

TS300-PCB – Testing on 300 mm Wafers and Large PCBs

MPI TS300-PCB – Testing on 300 mm Wafers and Large PCBs

TS300-PCB is MPI’s large, most versatile manual probe station offering testing on wafers up to 300 mm and large, up to 610 x 500 mm PCB boards. Besides MPI’s unique features, common for the manual probe systems such as the air-bearing stage or the Probe Hover Control PHC™, it incorporates a specially designed probe platen and large microscope movement in order to cover a large probing area.  These features make the system an ideal choice to address both RF, mmW, Signal Integrity measurements and Failure Analysis, Design Validation applications.

Features & Benefits

   Air-Bearing Stage

The MPI unique air-bearing stage design, with simple single-handed puck control, provided unsurpassed convenience of operation for fast XY navigation and quick wafer loading without compromising accurate and fine positioning capability with the additional fine and accurate 25×25 mm XY-Theta micrometer movement.

MPI TS300-PCB - Air Bearing Stage with Optional Fine-Adjustment Micrometers

Slider

Slider

Unique Platen Lift
with Probe Hover Control™

The highly repeatable (1 µm) platen lift design with three discrete positions for contact, separation (300 µm), and loading (3 mm) with a safety lock utility are all examples of unparalleled functionality incorporated into MPI TS300-PCB manual probe system. These features prevent unexpected probe or wafer damage while providing intuitive control, accurate contact positioning, and safety set-up. This capability is especially critical if probes in mmW and sub-THz range are so cost intensive.

Additional Probe Hover Control™ comes with hover heights (50, 100 or 150 µm) for easy and convenient probe to pad alignment.

Dedicated Probe Platen

TS300-PCB offers a standard 20 mm probe platen height movement and rectangular or arbitrary adjustments for MPI RF MicroPositioners providing TDR impedance, S-parameters, cross-talk, broadband S-parameter measurements up to 220 GHz. In combination with the large microscope movement and the special PCB holder, the platen design makes the system capable for probing over an expanded area of 20” x 18” (500 x 460 mm).

TS300-PCB – Dedicated Probe Platen offers standard 20 mm probe platen height movement

PCB Holder

TS300-PCB can accommodate a variety of ambient or 300 mm PRIME thermal chucks and/or a large holder for printed circuits board’s sizes up to 24” x 20”(610 mm x 500 mm). The dedicated PCB holder can be used for probing on smaller boards down to 2”x 2” (50 mm x 50 mm) or up to packaged ICs and incorporates two AUX chucks made of ceramics for accurate RF calibration in the mmW range.

TS300-PCB – PCB Holder accommodates variety of ambient or 300 mm PRIME thermal chucks and/or a large holder

MPI SENTIO® for Manual Probe Systems

By using a novel approach based on simplicity and truly intuitive operation, MPI was first to develop a revolutionary multi-touch prober control software suite to address today’s challenges of operating complex probe test systems.

This SENTIO® option enables the capability for MPI manual probe stations, such as to combine a programmable microscope stage for automated navigation of probing on mini pads or even programmable MicroPositioners for automated RF calibration.

MPI SENTIO® for Manual Probe Systems
error:

Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com