MPI PCB Probe Systems

MPI manual probe systems configured with variety of different holders

Every MPI manual probe systems can be configured with a variety of different holders for printed circuit boards (PCB’s) in order to provide in addition to on-wafer, versatile, convenient, and accurate Signal Integrity (SI) measurements with single-ended or differential RF probes. Measuring signals at the end of the channel for eye-patterns, deterministic jitter, distortion, TDR (Time Domain Reflectometry) impedance, cross-talk, coupling, and losses, or even S-parameters is easily accomplished.

MPI’s TS150-THZ & TS200-THZ systems extend  the frequency ranges up to sub-THz range, making these the most multi-purpose manual probe stations available anywhere.

TS300-PCB – Testing on 300 mm Wafers and Large PCBs

MPI TS300-PCB – Testing on 300 mm Wafers and Large PCBs

TS300-PCB is MPI’s large, most versatile manual probe station offering testing on wafers up to 300 mm and large, up to 610 x 500 mm PCB boards. Besides MPI’s unique features, common for the manual probe systems such as the air-bearing stage or the Probe Hover Control PHC™, it incorporates a specially designed probe platen and large microscope movement in order to cover a large probing area.  These features make the system an ideal choice to address both RF, mmW, Signal Integrity measurements and Failure Analysis, Design Validation applications.

Features & Benefits

   Air-Bearing Stage

The MPI unique air-bearing stage design, with simple single-handed puck control, provided unsurpassed convenience of operation for fast XY navigation and quick wafer loading without compromising accurate and fine positioning capability with the additional fine and accurate 25×25 mm XY-Theta micrometer movement.

MPI TS300-PCB - Air Bearing Stage with Optional Fine-Adjustment Micrometers

Unique Platen Lift
with Probe Hover Control™

The highly repeatable (1 µm) platen lift design with three discrete positions for contact, separation (300 µm), and loading (3 mm) with a safety lock utility are all examples of unparalleled functionality incorporated into MPI TS300-PCB manual probe system. These features prevent unexpected probe or wafer damage while providing intuitive control, accurate contact positioning, and safety set-up. This capability is especially critical if probes in mmW and sub-THz range are so cost intensive.

Additional Probe Hover Control™ comes with hover heights (50, 100 or 150 µm) for easy and convenient probe to pad alignment.

Dedicated Probe Platen

TS300-PCB offers a standard 20 mm probe platen height movement and rectangular or arbitrary adjustments for MPI RF MicroPositioners providing TDR impedance, S-parameters, cross-talk, broadband S-parameter measurements up to 220 GHz. In combination with the large microscope movement and the special PCB holder, the platen design makes the system capable for probing over an expanded area of 20” x 18” (500 x 460 mm).

TS300-PCB – Dedicated Probe Platen offers standard 20 mm probe platen height movement

PCB Holder

TS300-PCB can accommodate a variety of ambient or 300 mm PRIME thermal chucks and/or a large holder for printed circuits board’s sizes up to 24” x 20”(610 mm x 500 mm). The dedicated PCB holder can be used for probing on smaller boards down to 2”x 2” (50 mm x 50 mm) or up to packaged ICs and incorporates two AUX chucks made of ceramics for accurate RF calibration in the mmW range.

TS300-PCB – PCB Holder accommodates variety of ambient or 300 mm PRIME thermal chucks and/or a large holder

MPI SENTIO® for Manual Probe Systems

By using a novel approach based on simplicity and truly intuitive operation, MPI was first to develop a revolutionary multi-touch prober control software suite to address today’s challenges of operating complex probe test systems.

This SENTIO® option enables the capability for MPI manual probe stations, such as to combine a programmable microscope stage for automated navigation of probing on mini pads or even programmable MicroPositioners for automated RF calibration.

MPI SENTIO® for Manual Probe Systems

Field Application Engineer

Job Location: San Jose, CA

Job Duties:

  • Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
  • Collaborate with customers on their measurement challenges, and provide applications specific product training;
  • Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
  • Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
  • Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
  • Make recommendations regarding product improvement, new products, and quality enhancement;
  • Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
  • Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
  • Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

Job Requirements:

Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 6 months of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang