200 mm Wafer Prober | Probe Systems  | Wafer Test | Probe System | Probe Stations | Manual Probe System | Wafer Probe Testing 

Manual Probe Stations |  200 mm Wafer Prober

Characterizing Silicon Photonics | Wafer Test

150 mm Wafer Prober |  High Power Probe Station  

MPI High Power Manual Probe Systems


MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP and TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

Features & Benefits

Air-Bearing Stage

The MPI air-bearing stage design, with simple single-handed puck control, provides unsurpassed convenience of operation for fast XY navigation and quick wafer loading without compromising accurate and fine positioning capability with the additional fine and accurate 25x25mm XY-Theta micrometer movement.

MPI TS150-HP & TS200-HP - Air-Bearing Stage

10kV Coaxial or 3kV Triaxial Ambient Chucks

Chuck options include MPI’s 10 kV coaxial or 3 kV triaxial ambient chucks or various ERS thermal chucks to support temperature measurement from -60°C and up to 300 °C. The thermal touch controller is designed to be mounted on the prober itself for quick and convenient operation.

A chuck top tray, with electrical connection for biasing, is an easy add-on for any high power chucks at ambient temperature. The tray is designed to retain Fluorinert™ liquid for a cost effective anti-arcing solution.

*Fluorinert is a trademark of 3M Company, USA


High Voltage / High Current / Ultra High Power Probes

MPI high power probing solutions include dedicated High Voltage (HVP), High Current (HCP) and Ultra High Power (UHP) probes. MPI’s high voltage probes are capable of low leakage current measurements during high voltage tests up to 3kV triaxial or 5 & 10 kV in coaxial set-ups.

The HCP are using MPI propriety multi-contact tips for reduced contact resistance for ultra-high current measurements up to 600A (pulsed).

The UHP probes are combining both capabilities and eliminating the need to change probes for high voltage and current applications.


Safe and Accurate

The standard manual High Power probe systems are configured with a DarkBox providing an interlock for safety and EMI-shielding capability  in order to insure low-noise, accurate , and safety measurements.


Instruments Integration

TS150-HP/TS200-HP can be configured with variety of instrument connection packages, which consists of necessary high voltage / high current probes and cabling accessories for optimal connection to the test instruments such as Keysight B1505 (3 kV or 10 kV) or Keithley  2600-PCT-XB, including integration of 8020 High Power Interface Panel.



Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com