Silicon Photonics Probe Stations

Silicon Photonics Test 

SiPh Probe Stations

Silicon Photonics Wafer Probe

Silicon Photonics Probe Stations

Silicon Photonics Probing System

Silicon Photonics Wafer Probe

Silicon Photonics Wafer Probe Station

Silicon Photonics Automated Probe Systems

Silicon Photonics 300mm Wafer Probe Stations

Silicon Photonics 200mm Wafer Probe Stations

 Silicon Photonics 1500mm Wafer Probe Stations

Silicon Photonics Automatic Wafer Probe Station

Large Selection of Probe Stations
Large Selection of Wafer Probes
Silicon Photonics Probe Systems
Silicon Photonics Fiber Alignment

MPI SiPH Probe Systems


MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:

  • Various options of high-precision fiber alignment systems for ultra-fast scanning routines
  • Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration
  • Integrated Z-sensing for detecting the fiber to wafer contact point
  • Crash protection when using two optical fiber arms
  • Wide temperature range from -50°C to 200°C
  • Optional dark box for testing in light tight environment
  • Extensive software package for supporting easy integration to operator’s test executive
  • Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE

Features & Benefits

Silicon Photonics Fiber Alignment Systems

A Variety of fiber positioning stages and the related software can be easily used with the MPI SiPH probe system. The shortest platen to chuck distance allowing shorter fiber arms with higher stability and less measurement noise. Solutions for just single fiber or multi-fiber-arrays are available, all integrated with automated Z-sensing unit for constant distance of few micrometer to the optical I/O.

Silicon Photonics Alignment System Integration

Seamless Probe Station Integration

Necessary optical alignment stages, such as the hexapod, are fully integrated into the SENTIO® probe station control software. Those are operated just like any other automated positioner including its additional alignment features. And not only integrated in the multi touch software, even the hardware control panel supports the SiPH positioner type.

For easy test executive integration of the SiPH functionality MPI is providing free sample scripts. Those are covering all necessary operation required for automated testing.

Integrated SiPH Control Hardware

Embedded Hardware Control

The SiPH components shelf is designed to hold all the positioning control hardware, completely integrated without adding additional floor space. It is placed in user friendly distance for convenient setup operation. Additionally the standard probe station instrument shelf is available to place all required optical and electrical measurement equipment.

SiPH Integrated Measurement Instrumentation

Software Suite SENTIO®

MPI automated engineering probe systems are controlled by a unique and revolutionary, multi-touch operation SENTIO® Software Suite – simple and intuitive operation saves significant training time, the Scroll, Zoom, Move commands mimic modern smart mobile devices and allows everyone to become an expert in just minutes. Switching between the active application and the rest of the APPs is just matter of a simple finger sweep.

For easy test executive integration of the SiPH functionality MPI is providing free sample scripts. Those are covering all necessary operation required for automated testing.

MPI Software Suite SENTIO®

Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to