Probe Station

Wafer Carrier

Probe Systems

Wafer Swapping

300mm Automatic Wafer Carrier

300 mm Wafer Prober

Probe Station Wafer Carrier

Automated Probe Test

Fully Automatic Wafer Probe Systems

300mm Automated Probe Station

300mm Wafer Swapping

300mm Wafer Carrier

TS3500 Series with WaferWallet® = Accuracy + Flexibility + Automation

MPI TS3500-SE - 300 mm Automated Probe System with ShielDEnvironment™

TS3500 and TS3500-SE are equivalent in features to MPI’s well-known and established TS3000 and TS3000-SE 300 mm probe stations with the added fully-automated capability by configuring or upgrading with MPI’s unique WaferWallet® or WaferWallet®MAX. MPI’s solution is lowering the customer’s overall cost-of-test by providing full automation for less than other vendor’s semi-automated products.

It incorporates MPI advanced technologies, such as PHC™, as a standard feature, and mDrive™ and/or VCE™ optional or as an upgrade in the field.

Features & Benefits

The WaferWallet®

Common practice for Device Characterization in the Modeling and New Technology Development processes is to extract data from a typical few wafers via extremely accurate IV-CV, 1/f, RF, mmW, and Load-pull measurements.

MPI’s WaferWallet® extends the TS3500 series automation without compromising measurement capability. The WaferWallet® is designed with five individual trays for manual, ergonomic loading of 150, 200, or 300 mm “modeling” wafers. Fully-automated tests with up to five identical wafers at different temperatures are now possible.

MPI WaferWallet™

The WaferWallet® MAX

MPI’s WaferWallet® MAX is easy field upgradable to address the demand for faster time to market, collecting data from multiple 150 or 200 or 300 mm SEMI standard cassette.

Including advanced alignment technologies for pre-aligner and cassette scanner, optional top or bottom Wafer ID Reader and fully automatic exposure control, the WaferWallet® MAX is also available as an option for fully-automated measurements.

The MPI WaferWallet® MAX

Hot and Cold Wafer’s Swapping

Returning the chuck to ambient is no longer required during the wafer loading and unloading process. With the WaferWallet®, MPI provides valuable time savings via a unique capability of load/unloading wafers while the chuck remains at any test temperature.

Celadon’s Indexer™

The patented Indexer™ from Celadon is the industry’s first automatic, up to 5 probe cards changer. The combination with WaferWallet® (up to 5 wafers) or WaferWallet® MAX (up to 25 wafers) offers unsurpassed flexibility and automation for advanced device modeling and wafer level reliability measurements.

  • Can support up to five VC20™’s with Advanced Cantilever™ technology, at any variety and configuration
  • Card changes are complete in seconds
  • Fully programmable and SENTIO® integrated
  • Compatible to off-axis Probe-To-Pad-Alignment (PTPA) on TS3500 Series
  • Tested for hundreds of thousands of touchdowns
TS3500-SE with WaferWallet® & Celadon’s Indexer™

Test Automation

Simple and cost-effective manual in-tray wafer alignment via notch indicator makes initial wafer loading fast and reliable. Dependent upon operational methodology, other options include wafer Pre-aligner, ID reader or PTPA capability on the TS3500-SE are additional features increasing levels of automation.

Wafer ID Reader

SENTIO® Dashboard

MPI’s SENTIO® 3.0 Software Suite with advanced GUI design is based on the revolutionary patented technologies:

    • Multi-touch, intuitive operation
    • Single window GUI, like common mobile devices
    • Dashboard view of the system status for simplified navigation
    • Intelligent, predictable operational guidance
    • Free upgrades for the life of the probe station

    With a simple view of the WaferWallet®Dashboard, the operator can recognize the loaded or empty trays, wafer diameter
    (150 or 200 or 300 mm), flat/notch orientation, wafer ID (if applicable), percentage of WaferMap tested and much more.

    MPI Prober Control Software Suite SENTIO®
    error:

    Field Application Engineer

    Job Location: San Jose, CA

    Job Duties:

    1. Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
    2. Collaborate with customers on their measurement challenges, and provide applications specific product training;
    3. Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
    4. Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
    5. Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
    6. Make recommendations regarding product improvement, new products, and quality enhancement;
    7. Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
    8. Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
    9. Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

    Job Requirements:

    Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 1 year of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

    Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang