MPI RF Probe Stations | 300mm Probing Station | Wafer Probe Stations | RF Wafer Probing | Wafer Probe Testing | Manual Probe Stations  

Manual Probe Stations |  Semi-Automatic Probe Stations  | RF Probe Station | 300mm Probing System | Wafer Probe | Advanced Semiconductor Test

Wafer Probe Stations |  Silicon Photonics Probe Stations |  Manual Probe Stations |  Automatic Probe Systems  | Wafer Probing | Wafer Probe Stations   

Silicon Photonics | Wafer Probe Testing | Manual Probe Stations | Manual Probe Station | Wafer Probing | Semi-Automatic Probe Stations 

Advanced Semiconductor Test

Understanding Requirements

Relentless Innovation

Reducing Cost of Test

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Engineering Probe Systems

Visionary Ideas

Unmatched Value

Quality without Compromise

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RF Probes: 26 – 220 GHz

Unique MEMS Based Tips

Reduced Contact Probe

Multi-Contact Probes

High Power

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Advanced Semiconductor Test

Advanced Semiconductor Test

Understanding Requirements

Understanding Requirements

Relentless Innovation

Relentless Innovation

Reducing Cost of Test

AST Slide 1.fw
A201-1114-FFB81C

Engineering Probe Systems

Engineering Probe Systems

Visionary Ideas

Visionary Ideas

Unmatched Value

Unmatched Value

Quality without Compromise

Quality without Compromise

AST Slide 3_A_.fw
A201-1114-FFB81C

RF Probes: 26 – 220 GHz

RF Probes: 26 –110 GHz

Unique MEMS Based Tips

Unique MEMS Based Tips

Reduced Contact Probe

Reduced Contact Probe

Multi-Contact Probes

Multi-Contact Probes

High Power

High Power

AST Slide 2.fw
A201-1114-FFB81C
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Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com