High Power Probe Stations

Manual Probe Stations |  150 mm Wafer Prober

Characterizing Silicon Photonics | Probe System

High Power Probe Station | High Power Manual Probe Systems  

200 mm Wafer Prober |  Wafer Probing Station  | Automated Probe System | 300mm Probe Station |  Manual Probe Stations |  200 mm Wafer Prober  

Probe Stations

High Power Probe Stations

Wafer Probing System

High Power Probe Systems

Wafer Probe Stations

High Power Wafer Prober

RF Probe Stations

High Power Characterization

Manual Probe Systems

High Power Wafer Probing

Wafer Probing Station

Manual Wafer Probe Station

RF measurements
High Voltage Probes
 RF & mmW applications

MPI High Power Probe Systems

10 kV – 600 A

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. These systems support up to 3 kV triaxial / 10 kV coaxial and 600 A (pulsed) accurate measurements while providing a low-noise, fully shielded test environment.

High Power Probe System Solutions

MPI high power probing solutions offer variety of probing systems which include manualautomated and fully-automated versions to provide solution for different budgets and specific requirements.

Manual high power systems provide flexibility and cost-effective solutions for research institutes, universities, and foundries that need complex and accurate device characterization but not require to do high volume measurements. These systems are designed to connect with advanced high power measurement instruments to support advanced research works, without compromising the usability, safety and the measurement accuracy up to 3 kV (triax) / 10 kV (coax) and 600 A (pulsed).

MPI automated high power systems provide automated high through-put measurements by programming step-and-repeat functionality through MPI SENTIO® prober control software.

TS2000-DP is designed for open and flexible measurement set up with supporting over temperature measurement up to 300°C. Its open platen design makes it possible to upgrade system for voltage higher than 10 kV, in the future and hence provide value for your investment.

TS2000-HP and TS3000-HP comes with MPI ShielDEnvironment™, providing wide temperature range from negative temperature as low as -60°C to higher temperature of 300°C and ultra-low-noise measurement capability in addition.

TS2500 and TS3500 Series, can be configured as “High-Power” versions as well, in order to provide ultimate automation and flexibility of testing multiple wafers unintendedly.

MPI High Power Technologies

High Voltage, High Current and Ultra-High Power Probes

MPI high power probing solutions include dedicated high voltage, and high current probes, which use MPI propriety multi-contact tips for reduced contact resistance. MPI’s high voltage probes are capable of low leakage current measurements during high voltage tests up to 3 kV triaxial or 5 kV & 10 kV coaxial set-ups. In addition, MPI Ultra-High-Power probes provides solution for on wafer measurement of ultra-high power devices up to 10kV/600A.

Proprietary Triaxial Chuck Connection

MPI’s proprietary triaxial connector offers very easy reconfiguration between, ultra-low noise 3kV triaxial and 10kV coaxial set-ups without any changes to the chuck connection.

blank

High Power Chucks

The MPI ambient or ERS AirCool®  thermal Chucks supports wide-range of temperature from -60°C to 300°C are manufactured with low contact resistance and gold plated chuck tops. The chucks are fully integrated assemblies and are capable of holding wafers as thin as 70 µm. Users can configure high power chucks to support Taiko wafer types.

Anti-Arcing Options

LiquidTray™

Specially designed anti-arcing LiquidTray™ can be used for arcing suppressing by simply place on the high power chuck surface. Wafers can be safely placed inside the tray to submerge in the liquid for arcing free high voltage test.

 

MPI Anti-arcing LiquidTray™

Anti-Arcing Probe Card

In addition, MPI is offering optional temperature control of the pressurized air in a range of 20 to 200 °C, which correlate direct with the chuck set temperature. High-voltage testing without arcing at higher temperatures are possible now.

 

MPI Anti-arcing Probe Card

Safety Requirement

Regulatory approved, all MPI high power systems are configured with a safety interlock enabled dark box or an infrared laser light curtain design to provide a safe testing environment.

MPI High Power Selection Guide

  Manual 150 & 200 mm
Automated 150 & 200 mm
Automated 300 mm

TS150-HP

TS200-HP

TS2000-DP

TS2000-HP

TS2500

TS3000-HP

TS3500-HP
Ambient and Thermal Chucks
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
Thermal Range
20°C...300°C
-60°C...300°C
20°C...300°C
-60°C...300°C
20°C...300°C
-60°C...300°C
-60°C...300°C
Current Range
Max. 600A (pulsed)
TAIKO Wafer Support
Safety Protection & Interlock
DarkBox
ShielDEnvironment™
Light Curtain
DarkBox
ShielDEnvironment™
Light Curtain
DarkBox
ShielDEnvironment™
Light Curtain
ShielDEnvironment™
Light Curtain
Anti-Arcing Probe Card
Anti-Arcing LiquidTray™
-
ArcShield™
Wafer Loader
-
-
-
2x Cassettes
-
WaferWallet®

      Scroll Right  >>

      Scroll Right  >>

  Manual 150 & 200 mm
Automated 150 & 200 mm
Automated 300 mm

TS150-HP

TS200-HP

TS2000-DP

TS2000-HP

TS2500

TS3000-HP

TS3500-HP
Ambient and Thermal Chucks
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
3kV Triax &
10kV Coax
Thermal Range
20°C...300°C
-60°C...300°C
20°C...300°C
-60°C...300°C
20°C...300°C
-60°C...300°C
-60°C...300°C
Current Range
Max. 600A (pulsed)
TAIKO Wafer Support
Safety Protection & Interlock
DarkBox
ShielDEnvironment™
Light Curtain
DarkBox
ShielDEnvironment™
Light Curtain
DarkBox
ShielDEnvironment™
Light Curtain
ShielDEnvironment™
Light Curtain
Anti-Arcing Probe Card
Anti-Arcing LiquidTray™
-
ArcShield™
Wafer Loader
-
-
-
2x Cassettes
-
WaferWallet®

● recommended ○ available

Field Application Engineer

Job Location: San Jose, CA

Job Duties:

  • Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
  • Collaborate with customers on their measurement challenges, and provide applications specific product training;
  • Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
  • Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
  • Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
  • Make recommendations regarding product improvement, new products, and quality enhancement;
  • Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
  • Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
  • Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

Job Requirements:

Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 6 months of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang