Characterizing Silicon Photonics | Manual Probe Station |  Characterizing Silicon Photonics | Wafer Probe Stations300 mm Wafer Probing | Wafer Test |  Characterizing Silicon Photonics | Wafer Probe Testing 

Probe Station | 300 mm Wafer Probing

TS3000-SiPH Automated Probe System | Manual Probe Station

300 mm Probe Stations |  300mm Probe Station  

MPI NoiseShield™

MPI ShielDEnvironment™

MPI probe stations equipped with ShielDEnvironment™ – high performance local environmental chamber – such as TS200-SE, TS300-SE, TS2000-SE, TS3000-SE or TS3500-SE provide excellent EMI and light-tight shielded test environment for ultra-low noise measurements.

Best in class specification of MPI ShielDEnvironment™ are defined under real life testing conditions, which include four Kelvin DC probes. It makes MPI Shielded probe systems the benchmark for 1/f (Flicker) Noise and RTN measurements.

Features & Benefits

Extensive Shielding

The NoiseShield™ option provides shorter cable lengths to reduce parasitic capacitance to maximize the test system roll-off frequency. It also reduces external magnetic field influences on the measurement results and makes the 1/f, RTN setup more robust and test lab location less-independent.

The NoiseShield™ DUO enables dual channel, parallel measurements of 1/f noise and RTN with two pre-amplifier units of Primarius 9812DX and therefore twice increase the measurement volume at the same given time.

Seamless Integration

Low impedance cables, low-impedance system’s grounding and ferrite cores on the unique MPI Kelvin probes are part of the delivery in order to make the probe station completely “invisible” and to achieve measurement results to reach the limit of the instrumentation noise floor.

The NoiseShield™ design provides convenient set-up as well as, integrating ProPlus 9812DX High Precision LNA very close to DUT and supports DC or RF pad design.

For more please see here.

MPI NoiseShield™ - Seamless Integration

Field Application Engineer

Job Location: San Jose, CA

Job Duties:

  • Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
  • Collaborate with customers on their measurement challenges, and provide applications specific product training;
  • Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
  • Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
  • Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
  • Make recommendations regarding product improvement, new products, and quality enhancement;
  • Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
  • Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
  • Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

Job Requirements:

Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 6 months of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang