RF Calibration Substrates | RF Probe Equipment | Semiconductor Wafer Probe | RF Prober

RF Adapter |  MPI TITAN™ Probe  

TITAN Probes |  Semiconductor Wafer Prober  

RF Wafer Test Probe |  RF Probe  

RF Wafer Probe |  RF Wafer Probe  

TITAN™ Probe Technologies

Features & Benefits

MEMS Tips

Precisely manufactured, the MPI TITAN™ Probes incorporate perfectly-matched 50 Ω MEMS contact tips. They ensure unmatched calibration and measurement results over a widest frequency range thanks to superior probe electrical characteristics (minimal insertion loss and crosstalk as well as high return loss).

MPI TITAN™ Probes MEMS contact tips

Unique Contact Structure

Unlike any other tips on the market, MPI TITAN™ RF probes deliver an excellent and real time visibility of the tip contacts due to the unique protrusion tip design. For the first time, highly accurate positioning of the RF probe on calibration standards or DUT pads became possible even for unexperienced operators and without using probe alignment marks.

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Contact Quality

MPI Corporation expands the family of the RF TITAN Probe by introducing the TITAN-RC Probe. The new probe model features the contact tip width reduced by 33% down to 20 μm. Fully aligned with the industry trend towards further reduction of the pad size for RF devices and ICs, the TITAN-RC probe significantly reduces cost of test for next generation commercial RF and mm-wave silicon devices and ICs. It enables accurate, and reproducible measurement results obtained for Si devices with Al pad metallisation as small as 30 x 35 μm. TITAN-RC probes are available in GSG tips configuration with probe pitch from 50 μm to 150 μm.

MPI TITAN™ Probes - Reduced Contact Probe

Outstanding Lifetime

 

One of the strongest features of TITAN™ Probe technology is its uniform wear-out: after hundreds of thousands probe cycles, the length of the probe tip naturally shrinks. The electrical characteristics, however, remain unchanged due to the unique probe design. Thus, the life time of TITAN™ Probes outperforms the life time of comparable probe technologies.

Last but not least, TITAN™ Probes stand out thanks to a truly affordable price.

Probe Characteristics

26 GHz Probe Model: T26

MPI TITAN™ Probe - T26A-GSG150

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HP Probe Model: T26P

MPI TITAN™ Probe - T26P-GSG150

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40 GHz Probe Model: T40

MPI TITAN™ Probe - T40A-GSG150

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50 GHz Probe Model: T50

MPI TITAN™ Probe - T50A-GSG100

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67 GHz Probe Model: T67

MPI TITAN™ Probe - T67A-GSG100

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110 GHz Probe Model: T110

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26 GHz Probe Model: T26D

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Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com