Wafer Probe Stations
Wafer Probe Systems
Manual Probe Stations
Manual Probe Systems
Semiconductor Probe Station
Wafer Probing Station
Engineering Probe Stations
MPI Engineering Probe Systems
Variety of Test Systems
The MPI Advanced Semiconductor Test Division is providing a wide range of engineering probe systems addressing the specific requirements of various market segments and applications such as Device Characterization for modeling, Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well special requirements for MEMS, High Power, RF and mmW device testing.
The AST mission is to provide engineering Test Solutions with a Modest Price Structure that does not compromise quality in any way.
We guarantee the highest value for the price on all comparable products within our market – period.
The TS series modular design concept allows a unique upgrade path towards reduced cost of ownership.
MPI Advanced Semiconductor Test Division’s ability to understand customer and market requirements FAST and having the talent to turn those learnings into INNOVATIVE, never seen before Engineering Probe Systems, are the key differentiators to other products on the market.
As technology and innovation leaders MPI Engineering Probe Systems are pioneering in many areas with features only found on Advanced Semiconductor Test Division products.