Probe Stations

Wafer Probes

Wafer Probing

Probe Systems

Wafer Prober

Wafer Probe Stations

300mm Wafer Probe Stations

Manual Probe Stations

Manual Probe Systems

Semiconductor Probe Station

Wafer Probing Station

Engineering Probe Stations

MPI Engineering Probe Systems

Variety of Test Systems

The MPI Advanced Semiconductor Test Division is providing a wide range of engineering probe systems addressing the specific requirements of various market segments and applications such as Device Characterization for modelingFailure AnalysisDesign Verification, IC engineeringWafer Level Reliability as well special requirements for MEMS, High PowerRF and mmW device testing.

Wafer Probing

Our Mission

The AST mission is to provide engineering Test Solutions with a Modest Price Structure that does not compromise quality in any way.

We guarantee the highest value for the price on all comparable products within our market – period.

The TS series modular design concept allows a unique upgrade path towards reduced cost of ownership.

Relentless Innovation

MPI Advanced Semiconductor Test Division’s ability to understand customer and market requirements FAST and having the talent to turn those learnings into INNOVATIVE, never seen before Engineering Probe Systems, are the key differentiators to other products on the market.

As technology and innovation leaders MPI Engineering Probe Systems are pioneering in many areas with features only found on Advanced Semiconductor Test Division products.


The thoughtful and all-inclusive approach of integrating measurement instruments, high-power probes, Kelvin Probes, RF Probes, RF Calibration Software and Thermal Chucks, and variety of different Accessories clearly demonstrates the exceptional value of MPI engineering probe systems.

MPI ShielDCap™

Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to