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MPI Advanced Technologies & Accessories

4-Port RFs and 2-Port Kelvins Configuration on MPI ShielDEnvironment™ Systems

MPI become very fast the truly innovation leader in the Advanced Semiconductor Tests market. By offering wide range of system’s accessories and unique advanced technologies, such as Automated Test over Multiple Temperatures ATMT™, NoiseShield™, PHC™, VCE™, mDrive™, MPI is offering variety of complete test solutions at highest value.

From 50, 150, 200 or 300 mm, ambient coaxial, triaxial, RF and high power Chucks up to an extended range from -60°C to +300°C temperature range.

Diversity in design specific MicroPositioners with unique RF or Kelvin Probe Arms interfacing to many different applications.

MPI offers carefully selected or optional custom designed Optics to provide superior imaging for the best possible integration in different applications.

A wide slection of Systems Accessories completes the MPI portfolio.

Features & Benefits

ATMT™ DC

For DC over temperature measurements, Device Modeling and Wafer Level Reliability engineers are commonly using Celadon’s, high temperature, low leakage probe cards. MPI and Celadon are offering leading edge, complete measurement solutions, enabling Automated Test over Multiple Temperatures ATMT™ DC at wide temperature range: -60…300°C.

For more please see here.

ATMT™ RF

MPI’s SmartCarrier™ automatically compensate for the lateral expansions of the RF probes without the need for complex software or programmable MicroPositioners*.

In addition, SENTIO®‘s new ContactSense™ image processing is completing MPI’s Automated Test over Multiple Temperatures ATMT™ RF.

For more please see here.

* One programmable MicroPositioner is recommended for automated RF calibration by using QAlibria®

MPI Automated Test over Multiple Temperatures ATMT™ RF

Vertical Control Environment VCE™

Using a side view of the probe tips – the VCE™ easy wizard driven procedure, provides automated contact definition by working with DC or with RF MicroPositioner or even with probe cards. The automated tip height detection, saves significant time during initial contact setting and protects probes crashes and pad damages.

VCE™ is now available as an option for TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500, and TS3500-SE probe systems and is field upgradable for all those as well.

mDrive™

In addition to the standard joystick control, mDrive™ provides a truly intuitive, manual, one or two hands operation of all existing programmable stages, such as chuck, scope or MicroPositioners. X- and Y-axis fine control is available for the selected stage, where Z safety function requires additional enabling. The feature is available as an option for TS2000-SE, TS2000-IFE, TS3000, TS3000-SE, TS3500, and TS3500-SE probe systems and is field upgradable for all those as well.

Probe Hover Control PHC™

MPI was pioneering with Probe Hover Control PHC™ to provide new revolutionary manual control of the probe contact setting.

The separation distance between the probes and the pads can accurately control down to one micron accuracy by having permanent, direct feedback of actual lift distance withing SENTIO® Software Suite.

PHC™ is a standard feature for TS2000-IFE, TS3000, TS3000-SE, TS3500, and TS3500-SE, however available as an option for TS2000 Series and TS2000-SE, too, and is uniquely field upgradable for all those as well.

NoiseShield™

MPI’s NoiseShield™ is developed exclusively to deliver high customer value by reducing cost of tests. It offers in combination with MPI ShielDEnvironment™ an unsurpassed EMI-Shielding not only for the DUT but even for the measurement instrument (such as pre-amplifier unit), and for all cables and connectors.

This technology is available as an option for all MPI systems with ShielDEnvironment™ , such as TS200-SE, TS300-SE, TS2000-SE, TS3000-SE, and TS3500-SE and is field upgradable for all those as well.

For more please see here.