AST News
SEMICON Europa 2018
November 13-16, 2018 Messe München, Munich, Germany Booth No. A4-102 Participating Division: Probe Card Technologies | Thermal Test | Advanced Semiconductor...
read moreAsia-Pacific Microwave Conference 2018
November 6-9, 2018 Kyoto International Conference Center (ICC Kyoto), Japan Please visit our booth in Conference Room A and workshop in Room J, 2nd Floor Participating Division: Advanced Semiconductor Test Please add this workshop to your calendar. ⇒ Register Now...
read moreAutomotive Testing Expo 2018
Exhibition on: October 23-25, 2018 Hall B, The Suburban Collection Showplace, Novi, MI, USA Please visit us at Booth No. 8034 Participating Division: Thermal Test
read more2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)
October 16, 2018 Sheraton San Diego Hotel and Marina, California, USA Please come join the program in Bell Aire Ballroom North Participating Division: Advanced Semiconductor Test Please add the program to your calendar. ⇒ Register Now [Subject]: 7. High Frequency...
read moreProPlus and MPI Corporation Establish Strategic Partnership, Announce Availability of a Characterization and Modeling Solution
Cross-Licensing Agreement Brings Next-Level Wafer-Level Noise Characterization, Enabling High Throughput Measurements with Advanced Probing Technologies Taiwan, Dec. 12th, 2017 – ProPlus Design Solutions Inc. and MPI Corporation today announced a strategic...
read moreMPI Corporation Introduces New 300 mm PRIME™ Thermal Chuck Technology
Taiwan, Nov. 14th, 2017 – MPI Corporation has introduced a new 300 mm thermal chuck designated PRIME™ technology for wafer probe stations with full temperature range thermal testing while delivering unsurpassed performance and flexibility. Continuing the innovative...
read moreMPI Corporation Announced Successful Installation of the Next-Generation THZ Probe System at the Kollberg Laboratory of Chalmers University of Technology
Boosting Capabilities of Measurement Solutions for THz Frequencies with Unsurpassed Measurement Dynamic Range, Calibration and Measurement Reproducibility Taiwan, Oct. 6th, 2017 – MPI Corporation announced successful installation of the next-generation THZ probe...
read moreMPI Automated Systems Certified for IEC61010 and SEMI S2 Standards
Taiwan, August 17th, 2016 – MPI is proud to announce the successful completion of third-party conformity assessments (testing and certification) based on IEC 61010, EN ISO 12100 and SEMI S2 for all Advanced Semiconductor Tests (AST) automated probe systems. MPI has...
read moreMPI Corporation Announces Industry Acceptance of TS150-THZ Probe System
Taiwan, May 20th, 2016 – As a result of numerous orders corresponding with the growth of terahertz frequency range measurements in the wafer test market, MPI Corporation has received industry wide acceptance of the TS150-THZ probe station as the standard for these...
read moreMPI Corporation Introduces a New Fully-Automatic Probe System for RF Production Test
Taiwan, May 6th, 2016 – As the 200 mm wafer test market continues to expand, MPI Corporation is introducing a new fully automatic wafer probe system. The TS2500-RF addresses multiple production test market requirements which include Radio Frequency (RF) communication...
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