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Comprehensive Devices Efficient Turnkey Solutions
State of the Art Solutions for
Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies
for Photonics, Optoelectronics, Lasers and LED Industries
Advanced Semiconductor Test
Engineering Probe Systems
RF Probes
ThermalAir Series Temperature Forcing Systems
Environmental Test Chambers
Fast Temperature Cycling Test
-80°C to +225°C - Energy Efficient
Ultra-High Performance Probe Card
With the Lowest Cost of Ownership
Delivering Extreme Test Capabilities
APMC 2023
Advanced Semiconductor Test
Event
Date: December 5-8, 2023
Venue: Taipei International Convention Center (TICC)
Booth: A3
CES 2024
Thermal
Event
Date: January 9-12, 2024
Venue: Westgate Las Vegas & Las Vegas Convention and World Trade Center (LVCC)
Booth: 1817 (Westgate) ; 5677 (LVCC)
DesignCon 2024
Thermal | Advanced Semiconductor Test
Event
Date: January 31 - February 1, 2024
Venue: Santa Clara Convention Center
Booth: 1438
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
News
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
Advanced Semiconductor Test
News
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
News
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
News
Functional Test, 200C, Production Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
News
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon Cryogenic Minitile™
Celadon Systems
News
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
News
Modular, -65 to 200C, 100 channel, Probe Card