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LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

T201-1114-FFB81C.png
T201-1114-FFB81C.png

ThermalAir Series Temperature Forcing Systems

Environmental Test Chambers

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

LCD Driver Probe Card
PC201-1114-FFB81C

Ultra-High Performance Probe Cards

With the Lowest Cost of Ownership

Delivering Extreme Test Capabilities

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LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

State of the Art Solutions for

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

for Photonics, Optoelectronics, Lasers and LED Industries

AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

RF Probes

Engineering Probe Systems

Engineering Probe Systems

Temperature-Forcing-System.fw_-2.png
T201-1114-FFB81C.png

ThermalAir Series
Temperature Forcing Systems

ThermalAir Series
Temperature Forcing Systems

Environmental Test Chambers

Environmental Test Chambers

Fast Temperature Cycling Test

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

LCD Driver Probe Card
PC201-1114-FFB81C

Ultra-High Performance Probe Cards

With the Lowest Cost of Ownership

Delivering Extreme Test Capabilities

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Slider

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error:

Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com