Thermal Test

New

Take a tour of the exclusive MPI Thermal 3D Virtual Booth to explore the full product portfolio of ThermalAir TA-Series of Temperature Testing Systems.

MPI Thermal Temperature Test Solutions – New 3D Virtual Booth

SWTest Untethered 2020

Probe Card Technologies

Event

November 11, 2020 (PDT)

MPI Probe Card is going to take part in SWTest Untethered. It will be a one-day virtual Conference and Expo featuring two Keynote Speakers and seven Technical Presentations.

Source Measurement Solution Case Study for VCSEL / LD Testing Application

Photonics Automation

New

See how MPI teamed up with Tektronix to provide highly reliable source measurement solutions targeting the VCSEL / Laser Diode (LD) testing applications.

MPI Thermal Temperature Test Solutions - New Videos

Thermal Test

Video

Check out the new released ThermalAir Series Temperature Forcing Systems presentation videos. Discover how the Thermal technology brings temperature to your test workstation.

Watch The Webinar

Advanced Semiconductor Test

Webinar

Tiny PICs with Huge Impact: Meeting the Challenges of Photonic Integrated Circuits testing for next-generation networks.

Time: June 17, 2020

Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon devices

Advanced Semiconductor Test

Video

This presentation discusses solutions for both metrology-grade and production-suitable calibration methods and will share some experimental results and practical recommendations.

MPI Corporation at ICMTS 2020

Advanced Semiconductor Test

Video

A short video introducing MPI’s products and expertise showing how our systems have been developed to address a wide range of challenges surrounding device characterization and measurement analysis.

MPI Corporation at INMMiC 2020

Advanced Semiconductor Test

Video

This week MPI participated at INMMiC 2020 virtual conference hosted online with IEEE. Here is the video describing MPI’s products and expertise showing how our systems have been developed to address in the field of nonlinear microwave and millimetre-wave circuits and systems.

MPI TITAN™ Probe DC to 220 GHz

Advanced Semiconductor Test

New

The pioneering TITAN™ 220 GHz probe was developed in cooperation with Anritsu as an integrated component of the breakthrough VectorStar ME7838G 220 GHz broadband system.

MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements

Advanced Semiconductor Test

New

MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.

TS2000-SE Configured with the New MPI THZ-Selection

Advanced Semiconductor Test

New

MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.

MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization

Advanced Semiconductor Test

New

MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.