Optimize Your Testing
Comprehensive Devices Efficient Turnkey Solutions
State of the Art Solutions for
Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies
for Photonics, Optoelectronics, Lasers and LED Industries
Advanced Semiconductor Test
Engineering Probe Systems
RF Probes
ThermalAir Series Temperature Forcing Systems
Environmental Test Chambers
Fast Temperature Cycling Test
-80°C to +225°C - Energy Efficient
Ultra-High Performance Probe Card
With the Lowest Cost of Ownership
Delivering Extreme Test Capabilities
IEEE ISPSD 2023
Advanced Semiconductor Test
Event
Date: May 29 – June 01, 2023
Venue: Hong Kong Univ. of Science and Technology (HKUST)
Booth: 006
SWTest 2023
Probe Card | Celadon
Event
Date: June 5-7, 2023
Venue: Omni La Costa, Carlsbad, SD, CA, USA
Booth: 307, 309
International Microwave Symposium (IMS) 2023
Advanced Semiconductor Test | Thermal
Event
Date: June 13-15, 2023
Venue: San Diego Convention Center, CA, USA
Booth: 723
100th ARFTG Microwave Measurement Conference
Advanced Semiconductor Test
Event
Date: June 16, 2023
Venue: San Diego Convention Center, CA, USA (Co-located with IMS)
SEMICON China 2023
Probe Card | Photonics Automation | Advanced Semiconductor Test | Thermal | Celadon
Event
Date: June 29 – July 01, 2023
Venue: Shanghai New International Expo Centre (SNIEC)
Booth: E4343 (Hall E4)
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
Advanced Semiconductor Test
News
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
New
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
New
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
Celadon Systems
New
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
New
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
New
Modular, -65 to 200C, 100 channel, Probe Card
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
New
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)
