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Optimize Your TestingLearn More
State Of the Art
Solutions For Comprehensive Devices
Efficient Turnkey Solutions - LED Test, Sort and HandlingLearn More
High Performance Prober Systems
Photonics and LED Testing Solutions
High Speed Sorter Systems - Learn More
RF Probes
Engineering Probe Systems
Reducing Cost of TestAdvanced Semiconductor Test - TA5000 Series
Temperature Forcing SystemsLearn More
Environmental Test Chambers
Fast Temperature Cycling Test
-80°C to +225°C - Energy Efficient
Thermal Accessories that Meet Your Temperature Test Need
Thermal Test
New
MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.
MPI Thermal New ThermalAir TC-100 Gas Chiller
Thermal Test
New
Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.
Datasheet now available.
Enhanced Vertical Solution 80
Probe Cards
New
Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.
MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization
Advanced Semiconductor Test
New
MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.
TITAN™ Multi-Contact Probe Online Design Capture Form
Advanced Semiconductor Test
New
Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.
New 300 mm Fully-Automatic Probe Systems Series with WaferWallet™
Advanced Semiconductor Test
New
MPI introduces the fully-automatic TS3500 probe station series, configurable with unique MPI WaferWallet™ for simple and convenient handling of multiple wafer types and sizes.
Centre for Power Electronics Annual Conference 2019
Exhibition on July 3 - 4, 2019
Advanced Semiconductor Test
Holywell Park Conference Centre, Loughborough University, UK
Booth No. 2
Event
SEMICON West 2019
July 9 - 11, 2019
Probe Card Technologies | Thermal Test
Moscone Center, San Francisco, CA, USA
Booth No. 1842 in South Hall
Event
SEMICON Taiwan 2019
Sept 18 – 20, 2019
Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test
TaiNEX 1, Taipei, Taiwan
Booth No. K2360
Event
