Silicon Photonics | Thermal Test |  Logic Probe Card | Probe Card  |  Vertical Probe Card |  Thermal Forcing Systems |  Manual Probe Station  

Wafer Probe Card |  Semiconductor Test Equipment |  Logic Probe Card |  Probe Card |  Probe Card |  Thermal Forcing Systems |  Vertical Probe Card 

LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

Temperature-Forcing-System.fw_-2.png
T201-1114-FFB81C.png
Chamber.fw
Chamber.fw

ThermalAir Series
Temperature Forcing Systems

Environmental Test Chambers

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

previous arrow
next arrow
Slider

LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

State of the Art Solutions for

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

for Photonics, Optoelectronics, Lasers and LED Industries

AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Advanced Semiconductor Test

Engineering Probe Systems

Engineering Probe Systems

RF Probes

RF Probes

Temperature-Forcing-System.fw_-2.png
T201-1114-FFB81C.png
Chamber.fw
Chamber.fw

ThermalAir Series
Temperature Forcing Systems

ThermalAir Series
Temperature Forcing Systems

Environmental Test Chambers

Environmental Test Chambers

Environmental Test Chambers

Fast Temperature Cycling Test

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

previous arrow
next arrow
Slider

MPI Introduces Unique NoiseShield™ Option for 1/f (Flicker) & RTN Measurements

Advanced Semiconductor Test

New

MPI introduced a new NoiseShield™ option, which provides excellent EMI-shielding, low impedance grounding and shortest possible cable lengths to reduce parasitic capacitance and to maximize the test system roll-off frequency.

TS2000-SE Configured with the New MPI THZ-Selection

Advanced Semiconductor Test

New

MPI THZ-Selection converts TS2000-SE system into a dedicated, mmW and THz probe station, as the first one on the market.

The New MPI ITS25-THZ IMPACT™ Test Solution

Advanced Semiconductor Test

New

Enabling cost effective mmW and THZ testing with the highest possible measurement accuracy.

Factsheet now available.

Thermal Accessories that Meet Your Temperature Test Need

Thermal Test

New

MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.

MPI Thermal New ThermalAir TC-100 Gas Chiller

Thermal Test

New

Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.

Datasheet now available.

Enhanced Vertical Solution 80

Probe Cards

New

Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.

MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization

Advanced Semiconductor Test

New

MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.

TITAN™ Multi-Contact Probe Online Design Capture Form

Advanced Semiconductor Test

New

Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.

Laser Taiwan 2019

October 16-18, 2019

Photonics Automation

TaiNEX 1, Taipei, Taiwan

Booth No. M332

Event

SWTest Asia 2019

October 17-18, 2019

Probe Card Technologies

Hsinchu Sheraton Hotel, Taiwan

Booth No. 510

Event

Automotive Testing Expo 2019

Exhibition on October 22-24, 2019

Thermal Test

The Suburban Collection Showplace,
Novi, Michigan, USA

Booth No. 8034

Event

SEMICON Europa 2019

November 12-15, 2019

Probe Card Technologies | Thermal Test

Messe München, Germany

Booth No. B1101

Event

previous arrow
next arrow
Slider

WP Feedback

Dive straight into the feedback!
Login below and you can start commenting using your own user instantly