Probe Card |  Probe Card  |  Logic Probe Card |  Logic Probe Card |  Cantilever Probe Cards |  Probe Cards | High Frequency Probing  

LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

State of the Art Solutions for

Comprehensive Devices Efficient Turnkey Solutions

PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED industries

AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

Temperature-Forcing-System.fw_-2.png
T201-1114-FFB81C.png
Chamber.fw
Chamber.fw

ThermalAir Series
Temperature Forcing Systems

Environmental Test Chambers

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

previous arrow
next arrow
Slider

Thermal Accessories that Meet Your Temperature Test Need

Thermal Test

New

MPI Thermal provides full array of intuitive functioning accessories for the ThermalAir users to flexibly and accurately test their components or device at the thermal test workstation.

MPI Thermal New ThermalAir TC-100 Gas Chiller

Thermal Test

New

Discover the evolutionary ThermalAir TC-100 Gas Chiller which focuses on localized temperature inducing of continuous -80°C Clean Dry Air.

Datasheet now available.

Enhanced Vertical Solution 80

Probe Cards

New

Probe your device with MPI’s Enhanced Vertical Solution 80 to enjoy the benefit of stable performance. Contact us for detailed information on how we can probe more efficiently and effectively.

MPI Announced TITAN™ Multi-Contact Probe for RF IC Characterization

Advanced Semiconductor Test

New

MPI Corporation introduces the TITAN™ Multi-Contact Probe, the further advances of company’s TITAN™ RF probing technology for challenges of testing modern Si RF ICs.

TITAN™ Multi-Contact Probe Online Design Capture Form

Advanced Semiconductor Test

New

Request for quote now! – Use Online Design Capture Form to build your probe by choosing RF signal (S), logic (L) and power supply (P) channels according to your IC pad layout.

New 300 mm Fully-Automatic Probe Systems Series with WaferWallet™

Advanced Semiconductor Test

New

MPI introduces the fully-automatic TS3500 probe station series, configurable with unique MPI WaferWallet™ for simple and convenient handling of multiple wafer types and sizes.

SEMICON Taiwan 2019

Sept 18 – 20, 2019

Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test

TaiNEX 1, Taipei, Taiwan

Booth No. K2360

Event

International Conference on Silicon Carbide and Related Materials 2019 (ICSCRM) Tutorial Session Tabletop Exhibition

Sunday, September 29, 2019

Advanced Semiconductor Test

Kyoto International Conference Center

Room A

Event

European Microwave Week 2019

Exhibition on October 1-3, 2019

Advanced Semiconductor Test

Porte de Versailles Paris, France

Booth No. 770/765

Event

previous arrow
next arrow
Slider