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Ultra-High Performance Probe Card
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MPI Corporation’s Advanced Semiconductor Test Division Joins Forces with Keysight Technologies as a Keysight Solutions Partner
Advanced Semiconductor Test
News
Hsinchu, Taiwan – March 11, 2024
MPI Corporation, a global leader in semiconductor testing solutions, is pleased to announce a landmark partnership with Keysight Technologies, a global innovation partner delivering market-leading design, emulation, and test solutions to help engineers develop and deploy faster. This collaboration marks...
MPI Corporation’s Advanced Semiconductor Test Division Achieves Fully Traceable RF Calibration Breakthrough Up to 110 GHz
Advanced Semiconductor Test
News
Braunschweig, Germany, January 25, 2024
MPI Corporation’s Advanced Semiconductor Test (AST) Division, a pioneer in on-wafer testing solutions, today announced a landmark achievement in RF calibration technology. Collaborating with the Physikalisch-Technische Bundesanstalt (PTB)...
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
News
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
Advanced Semiconductor Test
News
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
News
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
News
Functional Test, 200C, Production Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
News
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon Cryogenic Minitile™
Celadon Systems
News
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
News
Modular, -65 to 200C, 100 channel, Probe Card