LED Tester

Photo Detector(PD) | LED Photo Detector(PD) | Advanced Package Testing | Photo Detector(PD) Wafer Probing | Optical Devices Testing | Photo Detector(PD) Probe Station | Photonics Systems

LED Probe System | Photo Detector Test | LED Probe Station | Optical Amplifier

Silicon Photonics | Wafer Level Photonics Test | LIV Test Systems | Silicon Photonics

Photo Detector Tester Wafer Probing | Photo Detector Test | Optical Devices Testing | Wafer Probe Testing

Optical Device Testing

Optical Device Test and Characterization

Optical Electrical Measurements

LED Chip Package Test

LED Probe Station

Advanced Package Testing

LED Chip Test

Silicon Photonics

Photo Detector

High Performance Prober Systems

High Speed Pulsed Optical Measurements

Optical Device Test and Characterization

MPI Testing Solution

Since 2008, MPI’s LED tester has provided optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.

For general LED chip and package testing, MPI PA division offers LEDA T200 for chip testing and T100 for package testing. Please contact MPI’s PA division with your specific requirements and let us design your next solution.

EXPLORE MPI PHOTONIC APPLICATIONS

MPI offers a comprehensive portfolio of test, measurement and inspection solutions meeting the demands of the Photonics, Optoelectronics, Semiconductor, and Laser industries.