Photo Detector(PD) Probe | Photo Detector(PD) Postioner |  Photo Detector(PD) | Photo Detector(PD) Probe Station | Photo Detector(PD) Photo Detector(PD) |  Photo Detector(PD) Probe Station |  Wafer Prober 

 

Photo Detector(PD) Probe Station | Wafer Probe Testing |  Photo Detector(PD) | Wafer Prober Machine 

Probe Station Comapany | Photo Detector(PD) Postioner |  Advanced Package Testing | Probe Station 

LED Photo Detector(PD) |  Silicon Photonics | Optical Devices Testing | Silicon Photonics |  200 mm Probe Station  

MPI Testing Solution

Since 2008, MPI’s LED tester has provided  optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.

For general LED chip and package testing, MPI PA division offers LEDA T200 for chip testing and T100 for package testing. Please contact MPI’s PA division with your specific requirements and let us design your next solution.

Please contact MPI’s PA division with your specific requirements and let us design your next solution.

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