Photo Detector(PD) Probe | Photo Detector(PD) Postioner |  Photo Detector(PD) | Optical Amplifier | Wafer Probe Testing |  Silicon Photonics | Photo Detector(PD) 

 

Optical Devices Testing | Photo Detector(PD) Probe Systems |  200 mm Probe Station | Photo Detector(PD) Photo Detector(PD) 

Photo Detector(PD) | Optical Devices Testing |  Advanced Package Testing | Photo Detector(PD) Probe Station 

Wafer Probe Testing |  Advanced Package Testing | Photo Detector(PD) Wafer Probing | Photo Detector(PD) Probe Systems |  Silicon Photonics 

MPI Testing Solution

Since 2008, MPI’s LED tester has provided  optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.

For general LED chip and package testing, MPI PA division offers LEDA T200 for chip testing and T100 for package testing. Please contact MPI’s PA division with your specific requirements and let us design your next solution.

Please contact MPI’s PA division with your specific requirements and let us design your next solution.