Test and Measurement Equipment | Wafer Prober Machine | Silicon Photonics | Manual Probe System | Silicon Photonics | Photonics Systems | Photonics Systems
Optical Devices Testing | Optical Amplifier | Photo Detector(PD) Probe Station | Wafer Prober Machine
Silicon photonics | Photo Detector(PD) calibration | Photo Detector(PD) Probe Station | Silicon Photonics
Optical Devices Testing Applications | Silicon Photonics | Photo Detector(PD) Wafer Probing | Wafer Probe Testing | Photonics Systems
MPI Testing Solution
Since 2008, MPI’s LED tester has provided optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.
For general LED chip and package testing, MPI PA division offers LEDA T200 for chip testing and T100 for package testing. Please contact MPI’s PA division with your specific requirements and let us design your next solution.
Please contact MPI’s PA division with your specific requirements and let us design your next solution.
Dive straight into the feedback!Login below and you can start commenting using your own user instantly