LED Tester

Silicon photonics | LED Photo Detector(PD) |  Advanced Package Testing | Probe Station | Photo Detector(PD) |  Photonics Systems |  Wafer Prober 

 

Optical Devices Testing | Optical Devices Testing |  Photo Detector(PD) | Prober Systems  

Photo Detector(PD) | Photo Detector(PD) calibration |  Advanced Package Testing | Silicon Photonics 

LED Photo Detector(PD) |  Photonics Systems | Optical Devices Testing | Wafer Probe Testing |  Optical Devices Testing  

Optical Device Testing

Optical Device Test and Characterization

 Optical Electrical Measurements

LED Chip Package Test

LED Probe Station

Advanced Package Testing

LED Chip Test

Silicon Photonics

Photo Detector

 High Performance Prober Systems

High Speed Pulsed Optical Measurements

Optical Device Test and Characterization

MPI Testing Solution

Since 2008, MPI’s LED tester has provided  optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.

For general LED chip and package testing, MPI PA division offers LEDA T200 for chip testing and T100 for package testing. Please contact MPI’s PA division with your specific requirements and let us design your next solution.

Please contact MPI’s PA division with your specific requirements and let us design your next solution.

error: