Probe Station Comapany | Wafer Probe Testing |  Photo Detector(PD) | Manual Probe System | Photo Detector(PD) Probe Systems |  Photo Detector(PD) | Photonics Systems 

 

Silicon Photonics |  Wafer Prober Machine |  Photonics Systems | Wafer Probe Testing 

Silicon photonics | Photo Detector(PD) |  Silicon Photonics | Silicon Photonics 

Photo Detector(PD) Postioner |  Photonics Systems | Manual Probe System | Silicon Photonics |  Optical Devices Testing  

MPI Testing Solution

Since 2008, MPI’s LED tester has provided  optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.

For general LED chip and package testing, MPI PA division offers LEDA T200 for chip testing and T100 for package testing. Please contact MPI’s PA division with your specific requirements and let us design your next solution.

Please contact MPI’s PA division with your specific requirements and let us design your next solution.

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