VEGA Series

High performance Laser Diode probe & test solutions

VEGA-Series-Slider-1-Overview
VEGA-Series-Slider-2-TP
VEGA-Series-Slider-3-FP
VEGA-Series-Slider-4-DP

VEGA Series

High performance Laser Diode probe & test solutions

CAPELLA-Series-Slider-1-Overview
CAPELLA-Series-Slider-2-TP
CAPELLA-Series-Slider-3-FP
CAPELLA-Series-Slider-4-DP
CAPELLA-Series-Slider-5-Application

VEGA Series Overview

MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets.

MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force.

High throughput tests of key device characteristics such as LIV, Far Field, and Near Field measurements are enabled by a comprehensive test and measurement suite capable of controlling a variety of measurement instruments on the market for optimal integration.
MARKETS SERVED
Optical Com. Optical Sensing

VEGA Top Prober (TP) Series Key Features

Extreme temperature test capability (-40˚ to +200˚C).
High performance loader system easily handles various device types such as thin/warped wafer, normal wafer, substrate, Packaged or other devices.
Multiple optics / detector choices to meet your exact needs to test LIV, Near Field, and Far Field optical characteristics.
Selectable contact mechanism options include: Probe Card Holder (PCH), Wedge Probe Card and MPI F1 Single Probe Module achieving high precision measurement.
MPI prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The MPI Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration: With MPI’s extensive instrument library, the MPI test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CAPABILITY
High Temp. Low Temp. Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Flip-chip Prober (FP) Series Key Features

Multiple contact mechanism options include: VPC, Probe Card Holder (PCH), Wedge Probe Card, and MPI F1 Single Probe Module.
Flexible structure for mounting multiple optics system for LIV, Near Field, and Far Field testing.

Maximum support for multiple probing schemes and optical
Input/output orientations:
- Wafer top side electrical probe + bottom side optical measurement
- Simultaneous probing of wafer top/bottom surfaces

MPI prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The MPI Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration: With MPI’s extensive instrument library, the MPI test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CAPABILITY
High Temp. Low Temp. Flexible Optics
CONFIGURATION
Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Die Prober (DP) Series Key Features

A wide range of configuration options perfectly designed for testing VCSELs, EELs, Packaged devices, and more.
Extremely fast probing and sorting cycle for reduced cost-of-test.
Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.
CAPABILITY
High Temp. Low Temp. Flexible Optics
CONFIGURATION
Semi Auto Fully Auto
DUT
VCSEL EEL PD

Are you interested in this product and need further information? please click below for a quick response or 

Email us: pa-sales@mpi-corporation.com

VEGA Top Prober (TP) Series Key Feature

MPI VEGA Prober series is ready to meet the diverse test and material handling requirements of the Laser Diode (VCSEL, EEL) and optical module markets. MPI VEGA probers are based on a highly flexible and reliable platform, enabling the test of a wide variety of device types (Wafer, Package & Singulated Die) over temperatures with the ability to handle thin/warped wafers. Multiple probing schemes are also supported with the ability to probe small pads with well-controlled needle force. High throughput tests of key device characteristics such as LIV, Far Field, and Near Field measurements are enabled by a comprehensive test and measurement suite capable of controlling a variety of measurement instruments on the market for optimal integration.
MARKETS SERVED
Optical Com Optical Sensing

VEGA Top Prober (TP) Series Key Feature

Extreme temperature test capability (-40˚ to +200˚C).
High performance loader system easily handles various device types such as thin/warped wafer, normal wafer, substrate, Packaged or other devices.
Multiple optics / detector choices to meet your exact needs to test LIV, Near Field, and Far Field optical characteristics.
Selectable contact mechanism options include: Probe Card Holder (PCH), Wedge Probe Card and MPI F1 Single Probe Module achieving high precision measurement.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

Multiple contact mechanism options include: VPC, Probe Card Holder (PCH), Wedge Probe Card, and MPI F1 Single Probe Module.
Flexible structure for mounting multiple optics system for LIV, Near Field, and Far Field testing.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Input/output orientations:
- Wafer top side electrical probe + bottom side optical measurement
- Simultaneous probing of wafer top/bottom surfaces

MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.
MPI SIRIUS prober control software provides comprehensive control functions from basic wafer alignment, mapping, probe mark inspection to the deployment of MPI’s advanced Needle Alignment Mechanism (NAM) technology.

The STARGAZER Photonics Test System features a user-centric design that can be flexibly configured and programmed according to your unique test requirements.

Flexibility: With support for multiple test recipes, the user can flexibly select or modify the workflow or edit parameters according to the product and tests being performed.
Production Management: Manage lab/production data via the intuitive and easy-to-use software interface. Integrated real-time system monitoring and reporting enable a smooth and fully unattended test process.
Seamless Integration:With MPI’s extensive instrument library, the STARGAZER test system can easily interface with mainstream third-party measurement instruments to meet your unique testing needs.

CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL PD

VEGA Top Prober (TP) Series Key Feature

A wide range of configuration options perfectly designed for testing VCSELs, EELs, Packaged devices, and more.
Extremely fast probing and sorting cycle for reduced cost-of-test.
Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.
CABABILITY
High Temp Low Temp Flexible Optics
CONFIGURATION
Manual Semi Auto Fully Auto
DUT
VCSEL EEL PD

Are you interested in this product and need further information? please click below for a quick response or 

Email us: pa-sales@mpi-corporation.com

Need help or have questions?

Field Application Engineer

Job Location: San Jose, CA

Job Duties:

  • Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
  • Collaborate with customers on their measurement challenges, and provide applications specific product training;
  • Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
  • Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
  • Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
  • Make recommendations regarding product improvement, new products, and quality enhancement;
  • Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
  • Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
  • Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

Job Requirements:

Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 6 months of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang