Wafer Probe Card | Low Force Probing | Low Force MEMS Probe Card | Vertical Driver Probe Card | Probe Card | MEMS Wire Needle | Low Force Probing
MEMs Probe Cards | MEMS Wire Probe Card | Probe Card | Vertical Driver Probe Card | Low Force Probe Card | Low Force Probe Card | MEMS Probe Card
Kestrel Probe Card
The Kestrel Probe Card is equipped with MEMS wire (MW) needle which is designed for the demand of low force probing. It also comes with the ability to satisfy high C.C.C. and high pin counts application. The MEMS process ensures highly consistent needle characteristics, and the special structure design enables precise alignment and planarity control.
Kestrel Key Features
- MEMS wire needle for Cu pillar bump probing
- Applicable for full array and multi-DUT layout
- Extreme low force below 2.2gf
- Ideal for pitch above 80μm
- Wire type needle for easy maintenance
- Applicable for auto assembly