ICMTS 2024


IEEE ICMTS (International Conference on Microelectronic Test Structures) 

The IEEE International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions.

    • Exhibition Dates: April 15-18, 2024
    • Venue: The University of Edinburgh, Edinburgh, Scotland
    • Booth: 6
    • Participating Division: Advanced Semiconductor Test