Official Virtual Patent Marking Page (U.S.)

The products and their applications listed on this page may be protected by patent laws in Taiwan (R.O.C.), the United States, China, and other countries or regions.
This information is intended to comply with the requirements of virtual patent marking as defined under applicable laws, including but not limited to 35 U.S.C. § 287(a) of the United States Patent Act.

The product list on this page may not include all products protected by patents.
Other products not listed here may also be covered by one or more patents in Taiwan, the United States, China, or other jurisdictions.
In addition, some patents may still be pending or may have been granted in other countries or regions.

 

MPI Probe Card ＜Cantilever Probe Card＞ This product series is protected by the following patents：
TWI458987；CNZL 2013 1 0165190.8TWI589882；CNZL 2015 1 0929670.6TWI704357；CNZL 2019 1 0644694.5
TWI704355；CNZL 2020 1 0336493.1TWI743730；CNZL 2021 1 0326823.3；US11585832
MPI Probe Card ＜Advanced Probe Card＞ This product series is protected by the following patents：
TWI428608；CNZL 2012 1 0293190.1；US9234917TWI481880；CNZL 2014 1 0037002.8；US9442135TWI750552；US11402407
TWI479158；US9823272TWI515437；US9423424
MPI Photonics Automation ＜High Performance Prober Systems＞ This product series is protected by the following patents：
TWI438461；CNZL 2012 1 0462130.8TWI498565；CNZL 2014 1 0022775.9
CNZL 2014 1 0022581.9		TWI652751；CNZL 2019 1 0192636.3
TWI742884；US11293973TWM639797；CNZL 2023 2 0066990.3；US12158493
MPI Photonics Automation ＜High Speed Sorter Systems＞ This product series is protected by the following patents：
TWI363394；CNZL 2008 1 0111349.7TWI447543；CNZL 2012 1 0220057.3TWI557825
TWI593469；CNZL 2015 1 0236307.6TWI574022
MPI AST ＜Engineering Probe Systems＞ This product series is protected by the following patents：
TWI530700；US9958477TWI664130；US10096505TWI583971；US10048844
TWI652489；US10678370TWI678749；US10976363TWI752317；US11036390
TWI702408；US11144198TWI716119；US10895587TWI765649；US11262401
TWI768733；US11353501
MPI Thermal ＜Temperature Cycling Test Equipment＞ This product series is protected by the following patents：
TWI561779；CNZL 2014 1 0037341.6；US 9377214TWI557354；CNZL 2014 1 0814084.2；US10359221TWI561776；CNZL 2014 1 0833876.4；US9889454
TWI544300；CNZL 2015 1 0220525.0；US10036591TWI669445；CNZL 2018 1 0841300.0