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Probe Cards
LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

Photonics Automation
PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

AST
AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

Thermal
T201-1114-FFB81C.png
T201-1114-FFB81C.png

ThermalAir Series Temperature Forcing Systems

Environmental Test Chambers

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

CELADON Probe Cards
LCD Driver Probe Card
PC201-1114-FFB81C

Ultra-High Performance Probe Cards

With the Lowest Cost of Ownership

Delivering Extreme Test Capabilities

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Probe Cards
LCD Driver Probe Card
PC201-1114-FFB81C
Advanced Cobra Probe Card
WAT Parametric Probe Card Low Leakage

Optimize Your Testing

Optimize Your Testing

Comprehensive Devices Efficient Turnkey Solutions

Comprehensive Devices Efficient Turnkey Solutions

State of the Art Solutions for

State of the Art Solutions for

Photonics Automation
PA201-1114-FFB81C
Fully Auto Laser Diode Prober

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies

for Photonics, Optoelectronics, Lasers and LED Industries

for Photonics, Optoelectronics, Lasers and LED Industries

AST
AST Slide 3_B_.fw
A201-1114-FFB81C
TS2000-SE.fw
TS3000-SE.fw

Advanced Semiconductor Test

Advanced Semiconductor Test

Engineering Probe Systems

RF Probes

RF Probes

Engineering Probe Systems

Engineering Probe Systems

Thermal
Temperature-Forcing-System.fw_-2.png
T201-1114-FFB81C.png

ThermalAir Series
Temperature Forcing Systems

ThermalAir Series
Temperature Forcing Systems

Environmental Test Chambers

Environmental Test Chambers

Fast Temperature Cycling Test

Fast Temperature Cycling Test

-80°C to +225°C - Energy Efficient

Probe Cards
LCD Driver Probe Card
PC201-1114-FFB81C

Ultra-High Performance Probe Cards

With the Lowest Cost of Ownership

Delivering Extreme Test Capabilities

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Field Application Engineer

Job Location: San Jose, CA

Job Duties:

1. Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
2. Collaborate with customers on their measurement challenges, and provide applications specific product training;
3. Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
4. Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
5. Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
6. Make recommendations regarding product improvement, new products, and quality enhancement;
7. Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
8. Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
9. Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

Job Requirements:

Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 1 year of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang