Optimize Your Testing
Comprehensive Devices Efficient Turnkey Solutions
State of the Art Solutions for
Advanced Wafer / DUT Automated Test, Measurement, and Inspection Technologies
for Photonics, Optoelectronics, Lasers and LED Industries
Advanced Semiconductor Test
Engineering Probe Systems
RF Probes
ThermalAir Series Temperature Forcing Systems
Environmental Test Chambers
Fast Temperature Cycling Test
-80°C to +225°C - Energy Efficient
Ultra-High Performance Probe Card
With the Lowest Cost of Ownership
Delivering Extreme Test Capabilities
Taiwan Innotech Expo 2023
Probe Card
Event
Date: October 12 - 14, 2023
Venue: TWTC Hall1, Taipei, Taiwan
TPCA Show 2023
Probe Card
Event
Date: October 25 - 27, 2023
Venue: TaiNEX 1, Taipei, Taiwan
Booth: L007
IMPACT 2023 Conference
Probe Card
Event
The Alignment Methodology of Interconnect Electrical Characterization between Frequency and Time Domain Approaches
Session Time: 17:20 - 17:35, October 26, 2023
Venue: TaiNEX1, Taipei, Taiwan
SWTest Asia 2023
Probe Card
Event
Session Time: 17:00 - 17:30, November 2, 2023
Venue: Sheraton Hsinchu Hotel, Hsinchu, Taiwan
Probe Card Maintenance with Artificial Intelligence Assistance System
Expo Date: November 2 - 3, 2023
MPI SENTIO® and QAlibria® Unsurpassed Usability is Now Extended to Automated Four-Port RF System Calibration
Advanced Semiconductor Test
News
Hsinchu, Taiwan, December 8, 2022
MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader in semiconductor RF test solutions, demonstrated unattended four-port RF calibration and measurements supported by the new versions of QAlibria® and SENTIO®, MPI’s...
TS2000-IFE Series – THZ Selection
Advanced Semiconductor Test
News
THZ-Selection converts the TS2000-IFE into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.
Celadon Multisite Tile-on-Card™ Production Probe Card
Celadon Systems
News
Functional Test, 200C, Production Probe Card
Celadon Cryogenic Minitile™
Celadon Systems
News
Cryogenic, 4K and 77K, Positioner Mounted, 22 pin Probe Card
Celadon VC20™, 45e™ Probe Card Adaptor, and Insertion Tool
Celadon Systems
News
Modular, -65C to 200C, 48 channel, probe card and adaptor, used for Modeling, Characterization, Parametric Test, and WLR testing
Celadon VC43™ and P9000 Production Parametric Probe Card
Celadon Systems
News
Modular, -65 to 200C, 100 channel, Probe Card
The Latest in mmWave and THz Test and Measurement Technology
Advanced Semiconductor Test
News
This eBook is a collection of articles on the various innovations in measurement methods and equipment that has been developed to address these higher frequencies ranging from mmWave up to 1.1 THz. (This eBook was published by Microwave Journal)