Temperature Cycle Chamber – Temperature Forcing Systems –  Temperature Testing Chamber –  Environmental Test Chambers –  Temperature Testing Chamber

 Thermal Test Equipment –  Thermal Cycle Chamber –  Temperature Testing Chamber –  Thermal Shock Chamber –  Temperature Testing Chamber

 Thermal Test Equipment –  Environmental Test Chambers –  Temperature Test Chambers – Temperature Forcing Systems –  Temperature Testing Chamber

 Environmental Test Chambers –  Thermal Cycle Chamber –  Temperature Chambers –  Environmental Test Chambers –  Test Chambers

Thermal Compact Chamber

TA-5000 ThermalAir Accessory 

The ThermalAir TA-5000 system provides temperature directly to the test application. The Clamshell Style compact chamber in standard and custom dimensions for many size devices and components in Aerospace, Semiconductor, RF Microwave, Automotive electronic, Fiber Optic and other Test Articles.
Our new thermal test technology gives the end user the ability to easily test while controlling the ramp rate speed with one touch temperature set point functions.

Small Temperature Chamber

Temperature Cycle Chamber –  Thermal Test Chamber –  Temperature Chambers –  Temperature Cycling Test – Temperature Test Chamber

Clamshell Compact Chamber

TA-5000 Compact Chamber
TA-5000B Clamshell Flex Hose Interface
Flex Input Hose Connection
TA-5000B Interface Clamshell
Flex Extender Gas Transfer Hose
TA-5000 Array of Accessories
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Benchtop Environmental Test Chambers

The MPI ThermalAir Temperature Cycling Systems and Thermal Test Chambers are Adaptable.

Whether you’re testing semiconductor devices, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, we can connect to your test setup to bring temperature cycling capabilities directly to your bench top or test station.


Download the Datasheets

Temperature Test at the Workstation

Electronics and Electromechanical components continue to infiltrate all aspects of commercial and industrial use. Temperature test of these devices, components and parts in manufacturing for consumer or industrial markets are required to assure quality and reliability.

Military Defense to Consumer Electronics to Transportation to Cloud Computing Data Centers demand safety, performance, and reliability continues to grow. These components require temperature conditioning and fast temperature cycling at ranges from as cold as -100C to +300C and beyond.

MPI Thermal localized temperature inducing test equipment brings temperature to your test. MPI thermal systems are portable and can easily be moved from one test station to another.  Temperature cycling, thermal profiling and other environmental temperature conditioning is why MPI Thermal systems are part of the manufacturing temperature test processes.

Temperature Cycle Chamber –  Thermal Test Chamber –  Temperature Test Chambers –  Temperature Cycle Chamber – Temperature Test Chamber

Compact BenchTop Environmental Test Chambers

 Temperature Controlled Chamber  –  Thermal Cycle Chamber –  Temperature Testing Chamber –  Thermal Shock Chambers –  Test Chambers


  • No LN2 or CO2
  • Interchangeable Chamber Sizes
  • Feed-Thru for connecting Wire & Test Cables to your DUT / UUT
  • User controlled Ramp Rates & Dwell Times
  • Frost Free Operation
  • Additional Internal Temperature Probe

Download the Datasheets


Clamshell Temperature Controlled Chamber – Opens and Closes Easily

Thermal Stream Dimensions

 Temperature Cycling Chamber –  Thermal Test Chamber –  Temperature Chambers –  Environmental Test Chambers –  Temperature Chambers

Control the Ramp Rate Transition Times

Thermal Air Main Screen
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ThermalAir temperature test cycling system easily exceeds the mil-spec temperature range of -55°C to +125°C (actual test range -80°C to +225°C). Fast temperature cycling test in just seconds.

The DC chiller and DC Heater patented technology runs at full temperature performance at any power frequency, 200VAC to 250VAC users facility with 50% greater energy efficiency.

Field Application Engineer

Job Location: San Jose, CA

Job Duties:

  • Assist in developing HW and SW measurement methodologies/solutions for analytical wafer probe solutions with signal applications from DC to millimeter wave frequencies as well as Silicon Photonics (SiPH);
  • Collaborate with customers on their measurement challenges, and provide applications specific product training;
  • Provide pre- and post-sale support to AST, customers, service department, and the sales channel developing HW and SW measurement solutions for analytical wafer probe stations;
  • Define application-specific solutions based on customer-provided device data and facilitate both customer and divisional teams to successful results;
  • Perform product training seminars for customer and sales channels as well as participate in trade shows and technical seminars;
  • Make recommendations regarding product improvement, new products, and quality enhancement;
  • Author, document, publish, and present measurement solutions via Seminars, Applications Notes, Briefs, and White Papers;
  • Prepare, plan, and assist with customer product demonstrations that highlight value-based differentiation of AST product offerings;
  • Develop unique and individual customer presentations designed to professionally position the MPI brand in the North American market and deliver formal presentations to customers.

Job Requirements:

Master’s degree in Electrical Eng., Electronics Eng., Physics, or Photonics; Must possess 6 months of relevant work experience; Travel to customers’ sites in US and headquarters in Taiwan is required.

Send resume to: MPI America, Inc., 2360 Qume Drive, Suite C, San Jose, CA 95131, Attn: Janet Chiang