Thermal Shock Test Chamber | Thermal Test Chamber | Thermal Shock | Thermal Shock Chamber | Thermal Cycling Chamber | Environmental Test Chamber

Thermal Shock Test Chamber

Thermal Shock Test Chambers

The MPI Thermal Shock Test Chamber is an Adaptable

Environmental Test Chamber

Whether you’re testing Semiconductor IC devices, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, we can connect to your test setup to bring thermal test capabilities directly to your bench top or test station

Thermal Shock Test Chamber | Thermal Test Chamber | Thermal Shock | Thermal Shock Chamber | Thermal Cycling Chamber | Environmental Test Chamber

Compact ChamberHood Thermal Shock Test Chamber Model
Used with ThermalAir Thermal Cycling Test System
Compact Thermal Shock Test ChamberClamhsell Model

Compact Bench Top Environmental Test Chamber Thermal Testing for different types of applications

Thermal Test Chambers

The MPI ThermalAir Clamshell Thermal Testing Chamber

Thermal Shock Test Chambers

ThermalAir Benchtop Test Chambers can be raised up and lowered down over your device under test. Temperature test and cycle your electronic and non-electronic components and other parts temperature range from -60°C to +200°C with temperature test uniformity unmatched by large thermal chambers.
ThermalAir 5000 Thermal Chamber Clamshell can be opened and closed for quick and easy loading / unloading your parts that need thermal testing and conditioning. Thermal test your electronic and non-electronic parts and other devices at temperatures from -60° to +150°C with a temperature accuracy and uniformity unmatched by large environmental test chambers.

Test Chamber | ThermalTesting Chamber | Environmental Benchtop Chamber | Temperature Benchtop Test Chambers | Thermal Benchtop Chamber | Thermal Testing Chamber  | Temperature Testing Chamber

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Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com