Climatic Chambers | Climatic Test Chambers | Small Climatic Chambers | Benchtop Climatic Chambers | Temperature Chamber | Environmental Climatic Test Chamber

ThermalAir Climatic Chambers

Climatic Test Chambers

The MPI ThermalAir Temperature Cycling and Thermal Conditioning System is an Adaptable

Climatic Chamber

Whether you’re testing semiconductor devices, semicondcutor IC’s, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, we can connect to your test setup to bring temperature capabilities directly to your bench top or test station
 Climatic Environmental Chamber Model
Used with ThermalAir Temperature Test System
 Climatic Test Chamber Clamhsell Model

Climatic Chambers | Climatic Test Chambers | Small Climatic Chambers | Temperature Chamber |  Temperature Test Chamber | Thermal Conditiong System | Environmental Temperature Chamber

Climatic BenchTop Test Chamber

Thermal Testing for different types of applications

ThermalAir Climatic Test Chambers can be raised up and lowered down over your device under test. Temperature test and cycle your electronic and non-electronic components and other parts temperature range from -60°C to +200°C with temperature test uniformity unmatched by large walk-in climatic chambers.
Climatic Test Chambers

Two Color Touch Screen Displays

The ThermalAir TA-5000A has a front panel display and a thermal head display. The thermal head color touch screen gives the user the ability to set temperature parameters and monitor all system operations at the test site location.

Download the Datasheets

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Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to