Benchtop Chamber | Benchtop Test Chamber | Environmental Benchtop Chamber | Benchtop Thermal Test Chambers | Thermal Benchtop Chamber | Thermal Test Benchtop Chamber  | Thermal Benchtop Test Chamber

Thermal Benchtop Test Chambers

Thermal Benchtop Test Chambers

The MPI ThermalAir  Environmental Test Chamber is an Adaptable

Thermal Benchtop Test Chamber

Whether you’re testing Semiconductor IC devices, automotive sensors, fiber optic components, microwave hybrids, MCMs, PCBs or any type of electronic and non-electronic parts, we can connect to your test setup to bring thermal test capabilities directly to your bench top or test station
Benchtop Test Chamber
Chamber Hood Benchtop Test Chamber Model
Used with ThermalAir Temperature Test System
Benchtop Test Chamber Clamhsell Model

Compact Environmental Bench Top Test Chamber

Thermal Testing for different types of applications

Benchtop Chamber | Benchtop Testing Chamber | Environmental Benchtop Chamber | Temperature Benchtop Test Chambers | Thermal Benchtop Chamber | Thermal Testing Benchtop Chamber  | Temperature Testing Benchtop Chamber

ThermalAir Benchtop Test Chambers can be raised up and lowered down over your device under test. Temperature test and cycle your electronic and non-electronic components and other parts temperature range from -60°C to +200°C with temperature test uniformity unmatched by large thermal chambers.
Benchtop Temperature Test Chambers

[rev_slider alias=”Footer Temp Future”]

[rev_slider alias=”mini-footer-slider”]

error:

Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com