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Low Leakage (WAT)

MPI has strong RD teams in parametric measure to support foundry fabrication both engineering and production wafer test. MPI’s WAT probe card is the possibility of high performance to address ultra low leakage and low capacitance requirements at the same time.

Low Leakage Features include:

  • Ultra low leakage
  • Cost-effective
Parametric Probe Card | Probe Card | Low Leakage (WAT) Probe Cards | Cantilever Probe Cards | Low Leakage Probe Cards

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