LCD Driver Probe Card |  Cantilever Probe Cards  |  Logic Probe Card |  Cantilever Probe Cards |  Probe Card |  Probe Cards |  Wafer Probe Card

 

LCD Driver Probe Card |  Cantilever Probe Cards  |  LCD Driver Probe Card |  Logic Probe Card |  LCD Driver Probe Card |  Logic Probe Card | LCD Driver IC

 

R+ & U+ Solution for High Speed Test

MPI developes its proprietary R+ and U+ technology for high speed test which are using on Logic ,Memory and LCD driver ICs. Both of R+ and U+ technology are providing the best to both engineering and production with patent coverage.

HSPC Features include:

  • Impedance matching probe structure
  • Available for the speed up to Gbps level
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