SEMICON West 2019
Exhibition on July 9-11, 2019Moscone Center, San Francisco, CA, USAPlease visit us at Booth No. 1842 in South HallParticipating Division: Probe Card Technologies | Thermal Test
Semiconductor Wafer Test Workshop
Workshop on June 2-5, 2019Rancho Bernado Inn, San Diego, CA, USAPlease visit us at Booth No. 25Participating Division: Probe Card Technologies
IS-Test Workshop 11
Workshop on May 6-7, 2019 Munich Airport Marriott Hotel, Freising, Germany Participating Division: Probe Card Technologies [Presentation] Probe Card High Speed Test And The Application [Presenter] Cary Chen (MPI Corporation), Mohammed Ibrahim (htt Group) [Date]...
Semicon West 2018
Exhibition on July 10-12, 2018 Moscone Center, San Francisco, CA, USA Please visit us at Booth No. 6169 in North Hall Participating Division: Probe Card Technologies | Thermal Test
IEEE Semiconductor Wafer Test Workshop 2018
Exhibition on June 3-6, 2018 Rancho Bernado Inn, San Diego, CA, USA Please visit us at Booth No. 9 Participating Division: Probe Card Technologies
ADVANTEST DEVELOPER CONFERENCE 2018
Exhibition on May 23, 2018 Sheraton Hsinchu Hotel, Hsinchu, Taiwan Participating Division: Probe Card Technologies
SEMICON CHINA 2018
Exhibition on March 14-16, 2018 New International Expo Centre, ShangHai, China Please visit us at Booth No. 3151, Hall N3 Participating Division: Probe Card Technologies | Thermal Test | Advanced Semiconductor Test
SEMICON Europa 2017
November 14-17, 2017 Messe München, Munich, Germany Booth #: B1-120 Participating Division: Probe Card Technologies | Photonics Automation | Thermal Test | Advanced Semiconductor Test
TPCA Show 2017
Exhibition on October 25-27, 2017 Taipei Nangang Exhibition Center, Taipei, Taiwan Please visit us at Booth No. J331 Participating Division: Probe Card Technologies
MPI Corporation’s collaboration with htt Group
Taiwan, May 11th, 2017 – MPI Corporation is proud to announce a formal agreement with htt Group for the distribution of MPI’s Probe Card Division products throughout Europe. This agreement includes the installation of equipment, training and personnel for the repair...
IEEE Semiconductor Wafer Test Workshop
June 4-7, 2017 Rancho Bernardo Inn, San Diego, CA, USA Please visit us at Booth No. 9
ADVANTEST DEVELOPER CONFERENCE 2017
Exhibition on May 16-17, 2017 Hyatt Regency Indian Wells Resort & Spa (Indian Wells Ballroom) Please visit us at Booth No.12 Participating Division: Probe Card Technologies Exhibition on May 26, 2017 Intercontinental Shanghai Pudong Please visit us at Booth No.5...
SEMICON CHINA 2017
Exhibition on March 14-16, 2017 New International Expo Centre, ShangHai, China Please visit us at Booth No. 4143-2 Participating Division: Probe Card Technologies | Photonics Automation | Thermal Test | Advanced Semiconductor Test
High Frequency/Speed Layout Seminar
Exhibition: August 22, 2016 (12:50~16:00) No.22, Jhonghua Rd., Hukou Township, Hsinchu County, Taiwan Please visit us at Hsinchu Industrial Park Service Center , Convention Room Participating Division: Probe Card Technologies
IEEE Semiconductor Wafer Test Workshop
June 5 – 8, 2016 Rancho Bernardo Inn, San Diego, CA, USA Please visit us at Booth No. 2
ADVANTEST DEVELOPER CONFERENCE 2016
Exhibition on May 10-11, 2016 Paradise Point Resort, San Diego, California Please visit us at Booth No.5 Participating Division: Probe Card Technologies Exhibition on May 18, 2016 Sheraton Hsinchu Hotel, Taiwan (3F,Ball room I ) Please visit us at Booth No.5...