LED Probe Station

Probe Station Comapany | Wafer Probe Testing |  Silicon Photonics | Photo Detector(PD) Probe Station | Photo Detector(PD) Wafer Probing |  Optical Devices Testing |  Wafer Prober 


Micro LED Test | MEMs Test Systems |  Photonics Test Systems | Prober Systems  

LED Probing System | Photo Detector Test |  Silicon Photonics | MicroLED Measurememnt Systems 

LED Probing System | Photo Detector Test |  Photonics Systems | Optical Amplifier 

LED Chip Probers

Back Side Wafer Prober system

Test & Measurement

Wafer Chip Prober Systems

LED Probe Station

Advanced Package Testing

Singulated Die Prober system

Silicon Photonics

Photo Detector

 High Performance Prober Systems

High Speed Pulsed Optical Measurements

Optical Device Test and Characterization

MPI LEDA Line Wafer/Chip Probers

LED Wafer Probers | LED Chip Probes | LED Probe Systems | LED Chip Probing Systems
Whether you need a high performance, cost-effective or specialty prober system, MPI offers LEDA brand, one of the most comprehensive ranges of LED wafer/chip probers available on the market. The wide selection of LED wafer/chip probers are curated to address the test and measurement challenges for virtually any testing application that is related to the LED Front End (FE) /Back End (BE) production processes. Starting from 2001, MPI has been working with our customers in order to develop revolutionary wafer/chip probing solutions for the LED industry. We have gained invaluable manufacturing experiences ranged from low current, thermal management, light source control, and high speed testing. The LEDA brand wafer/chip probers are built upon MPI’s decades of engineering experience with ultimate commitment to drive innovation that accelerates our customer’s success.
The LEDA wafer/chip prober line portfolio is divided into three primary product categories: Top Side Wafer Prober system, Back Side Wafer Prober system, and Singulated Die Prober system — all with the highest level of upgradability and customizability to perfectly support the testing environment of diversified LED structures including Lateral, Vertical, and Flip Chip applications. Please contact MPI through the form below with questions or customization requirements. We are more than happy to assist in any way!


MPI offers a comprehensive portfolio of test, measurement and inspection solutions meeting the demands of the Photonics, Optoelectronics, Semiconductor, and Laser industries.

MPI Photonic solutions for Optical Communication applications (Datacom, Telecom, Laser, Photodetector, Photodiode)


Precision test and measurement solution for optical devices such as Photo Detectors and Laser Diodes

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)


Turn-key solution addressing 3D sensing consumer (Facial Recognition, Gesture Recognition, AR) and Automotive (LiDAR) applications

MPI Photonic solutions for Micro Display applications (Micro LED, Mass Transfer, VR, AR)


Accurate probing tool combined with idea mass transfer method

MPI Photonic solutions for LED applications (Automotive / General Lighting)


Complete solution covers testing, sorting, and inspection from wafer to package die level

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)


Dedicated SiPH on-wafer tests designed to perform repeatable low noise measurements

Need help or have questions?


Sr. Field Service/Repair Engineer (2 openings)

Job Duties:
Responsible for repair of very high pin count (>30,000 pins) MEM's, vertical and cantilever probe cards (VPC and CPC). Replace PCB electrical components such as: Capacitors, resistors, special MUX IC. Adjust VPC space transformer flatness between MLO substrate and PCB by interposer connection. Evaluate customer feedback on probe card issue and take full card inspection to find the root cause. Provide technical support to customer’s new probe card verification on wafer sort and debug to identify setup issues, wafer product issues or program issues. Conduct training on new probe card and new technology application, including on-line clean and off-line maintenance. Contribute to probe card technical improvement to HQ production line. 30% domestic travel required (travel within US to customers’ sites for field service and repair support)

Job Requirements:
5 yrs. field service support and repair of high pin count (>30,000 pins) vertical probe card and cantilever probe card.

Send resume with Job # 202108  to CareerswithMPIAmerica@mpi-corporation.com