Photo Detector(PD) | Photo Detector(PD) Postioner |  Advanced Package Testing | Manual Probe System | Silicon Photonics |  Photonics Systems | Photo Detector(PD) 

 

Photo Detector(PD) Probe Station | Photo Detector(PD) Wafer Probing |  Silicon Photonics | Photo Detector(PD) Photo Detector(PD) 

Silicon photonics | Photo Detector(PD) |  Advanced Package Testing | Photo Detector(PD) Wafer Probing 

Optical Devices Testing Applications | MPI Probe Station | Photo Detector(PD) Wafer Probing | Photo Detector(PD) Photo Detector(PD) |  Photo Detector(PD) Probe Station  

MPI AOI Series

Since 2009, MPI’s PA division has been offering advanced Automated Optical Inspection (AOI) systems complimenting the prober and sorter solutions. With a rigid table, accurate vision system, smart image analysis algorithms and an innovative light source, the LEDA brand AOI series offer fast and accurate inspection of GaAs, GaN, and vertical devices.

In LED chip process, the LEDA brand AOI systems specialize in defects analysis after probing/sorting. The system not only detects chip crack and extension defects, but more critical aberrations such as finger damage, active area peeling, pad contamination, mesa touches, and more. These systems also incorporate professional loader systems giving the highest throughput and flexible production management.

Please contact MPI’s PA division with your specific requirements and let us design your next solution.