Probe Station Comapany | Test and Measurement |  Photonics Systems | Manual Probe System | Photo Detector(PD) |  Photo Detector(PD) Probe Station | Wafer Probe Testing 


Optical Devices Testing | Optical Devices Testing |  Silicon Photonics | Optical Amplifier 

Probe Station Comapany | Wafer Prober Machine |  Advanced Package Testing | Photo Detector(PD) Wafer Probing 

LED Photo Detector(PD) |  Advanced Package Testing | Manual Probe System | Photo Detector(PD) Photo Detector(PD) |  Optical Devices Testing  

MPI AOI Series

Since 2009, MPI’s PA division has been offering advanced Automated Optical Inspection (AOI) systems complimenting the prober and sorter solutions. With a rigid table, accurate vision system, smart image analysis algorithms and an innovative light source, the LEDA brand AOI series offer fast and accurate inspection of GaAs, GaN, and vertical devices.

In LED chip process, the LEDA brand AOI systems specialize in defects analysis after probing/sorting. The system not only detects chip crack and extension defects, but more critical aberrations such as finger damage, active area peeling, pad contamination, mesa touches, and more. These systems also incorporate professional loader systems giving the highest throughput and flexible production management.

Please contact MPI’s PA division with your specific requirements and let us design your next solution.