Automated Optical Inspection

Photo Detector(PD) Probe | Optical Devices Testing |  Silicon Photonics | Photo Detector(PD) Probe Station | Wafer Probe Testing |  Optical Devices Testing |  Wafer Prober 

 

Silicon Photonics | Photo Detector Test |  Photo Detector(PD) Test System | Silicon Photonics 

LED Probing System |  Photonincs Test Systems |  LIV Test Systems | MicroLED Measurememnt Systems 

Silicon Photonics | Optical Devices Testing |  Silicon Photonics | Photonics Systems 

MPI AOI Series

Since 2009, MPI’s PA division has been offering advanced Automated Optical Inspection (AOI) systems complimenting the prober and sorter solutions. With a rigid table, accurate vision system, smart image analysis algorithms and an innovative light source, the LEDA brand AOI series offer fast and accurate inspection of GaAs, GaN, and vertical devices.

In LED chip process, the LEDA brand AOI systems specialize in defects analysis after probing/sorting. The system not only detects chip crack and extension defects, but more critical aberrations such as finger damage, active area peeling, pad contamination, mesa touches, and more. These systems also incorporate professional loader systems giving the highest throughput and flexible production management.

EXPLORE MPI PHOTONIC APPLICATIONS

MPI offers a comprehensive portfolio of test, measurement and inspection solutions meeting the demands of the Photonics, Optoelectronics, Semiconductor, and Laser industries.

MPI Photonic solutions for Optical Communication applications (Datacom, Telecom, Laser, Photodetector, Photodiode)

OPTICAL COMMUNICATIONS

Precision test and measurement solution for optical devices such as Photo Detectors and Laser Diodes

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)

OPTICAL SENSING

Turn-key solution addressing 3D sensing consumer (Facial Recognition, Gesture Recognition, AR) and Automotive (LiDAR) applications

MPI Photonic solutions for Micro Display applications (Micro LED, Mass Transfer, VR, AR)

MICRO DISPLAY

Accurate probing tool combined with idea mass transfer method

MPI Photonic solutions for LED applications (Automotive / General Lighting)

LED

Complete solution covers testing, sorting, and inspection from wafer to package die level

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)

SILICON PHOTONICS

Dedicated SiPH on-wafer tests designed to perform repeatable low noise measurements

Need help or have questions?

error: