Optical Sensing
Optical Sensing
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OPTICAL SENSING TEST SOLUTIONS

Vertical Cavity Surface Emitting Laser (VCSEL) based optical sensing technologies are finding their way into numerous consumer (Facial Recognition, Gesture Sensing, Augmented Reality) and automotive (LiDAR and In-Cabin Monitoring) applications. MPI’s comprehensive portfolio of test and measurement solutions are ready to meet the demands of the VCSEL based optical sensing market.

MPI wafer/chip probers for VCSEL and Laser Diode testing

MPI’s array of optical sensing solutions are well suited for the demands of both production and

engineering environments. We are ready to meet customer’s critical testing and back-end processing needs:

  • pParametric Test and Measurement
  • pMaterial Handling
  • pInspection
  • pWafer Level Reliability Test (WLBI)

 

MPI optical sensing solutions have been designed to meet the entire spectrum of VCSEL designs

and configurations.

  • pFront Emitting VCSEL
  • pRear Emitting VCSEL (Flip-Chip)
  • pWafer, Package, & Die Level

THE TECHNOLOGY

The Light-Current-Voltage (LIV) sweep test is a fundamental optical measurement used to determine the operating characteristics of devices such as laser diodes (LDs) and VCSELs.

MPI specializes in integrating a variety of Source and Measurement Units (SMU) providing accurate and synchronized power and voltage measurements in both pulsed (mS to nS) and CW modes.

 

  1. 1.High speed nanosecond test instrumentation capability
  2. 2.Electrical, Mechanical & Thermal system design to minimize the effects of self-heating, contact resistance and parasitics.
  3. 3.High speed optical measurements using integrating spheres for both low and high power VCSELs.

Pulse Width at 10ms

Pulse Width from 10ms to 500ms

High Speed Pulsed Optical Measurements

  • Laser Diode Driver Integration for LiDAR / Time of Flight (TOF) applications
  • High fidelity current stimulus control enabled by MPI’s high frequency probe card technologies
  • Synchronized electrical/optical measurements and data capture
  • Interleaved current pulse generation for enhanced high throughput testing

High Speed Pulsed Optical Measurements

  • Laser Diode Driver Integration for LiDAR / Time of Flight (TOF) applications
  • High fidelity current stimulus control enabled by MPI’s high frequency probe card technologies
  • Synchronized electrical/optical measurements and data capture
  • Interleaved current pulse generation for enhanced high throughput testing

Spectrum Measurement

-40o ~ 125o Measurement Capability

Laser Characterization

Laser Characterization

Laser Electrical / Optical performance  characterization

THE BENEFITS

Superior Optical Expertise and System Integration Capability for Customer’s
Requiring High Volume Manufacturing, Development and Test of Laser Diodes

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  High precision test and measurement results

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  High quality probing with optimizing automation

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  Proactive service and training support to keep your equipment running with minimal interruptions

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  Controlling all aspects of mechanical/electrical device contact

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  Customer-centric customizable solutions for your specific requirements

Far Field Measurements are used to characterize a VCSEL Array’s optical profile at longer working distances.

MPI specializes in:

1.Optical system design and integration to achieve high quality Far Field images with working distances ranging from 4mm to 1.5mm or more

2.Typical Far Field optical measurements include:

  • Divergence Angle
  • Eye Safety
  • Uniformity
  • Efficiency

3.Both Panel and Direct measurement methodologies are supported

MPI Far Field measurement VCSEL array

VCSEL Array (Far Field Measurement)

MPI Far Field measurement VCSEL array with lens attached

VCSEL Array with Lens Attached (Far Field Measurement)

Far Field Optical Measurement

Far Field measurement examples of  different device types

Eye Safety Measurement

Integrated analysis software for eye safety calculations

MPI eye safety software calculation for Laser Diode testing

Laser Eye Safety Calculation


MPI Far Field testing structure with Direct Camera

Direct Camera Far Field 
Measurement

MPI Far Field light collection structure: panel with direct camera

Far Field Light Collection Structure
(Panel with Direct Camera)

Far Field Optical Measurement

Two Far Field measurement options are available for specific optical device test requirements

VCSEL Array (Far Field Measurement)

VCSEL Array with Lens Attached (Far Field Measurement)

Far Field Optical Measurement

Far Field measurement examples of  different device types

Eye Safety Measurement

Integrated analysis software for eye safety calculations

Laser Eye Safety Calculation


Direct Camera Far Field 
Measurement

Far Field Light Collection Structure
(Panel with Direct Camera)

Far Field Optical Measurement

Two Far Field measurement options are available for specific optical device test requirements

Explore More MPI PHOTONIC SOLUTIONS

MPI Photonic solutions for Optical Communication applications (Datacom, Telecom, Laser, Photodetector, Photodiode)

OPTICAL COMMUNICATIONS

Precision test and measurement solution for optical devices such as Photo Detectors and Laser Diodes

MPI Photonic solutions for Optical Sensing applications (VCSEL, LiDAR, ToF, Time-of-Flight, 3D Sensing, Facial Recognition, Automotive sensing)

SILICON PHOTONICS

Dedicated SiPH on-wafer tests
designed to perform repeatable
low noise

MPI Photonic solutions for Micro Display applications (Micro LED, Mass Transfer, VR, AR)

MICRO DISPLAY

Accurate probing tool combined
with idea mass transfer method

MPI Photonic solutions for LED applications (Automotive / General Lighting)

LED

Complete solution covers testing, 
Sorting, and inspection from wafer 
to package die level

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