Spring MOS-AK Workshop at DATE

MPI Semiconductor ATE |  Temperature Test  |  Semiconductor Test  300mm Probe Stations   Semiconductor Wafer Test Systems |  Semiconductor Wafer Probing

 

  • March 31, 2017
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please come join the first afternoon workshop:
    “New Approach to Reduce Time-to-data when Characterizing Advanced Semiconductor Devices” by Dr. Andrej Rumiantsev
  • Participating Division: Advanced Semiconductor Test
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