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  • November 6-9, 2018
  • Kyoto International Conference Center (ICC Kyoto), Japan
  • Please visit our booth in Conference Room A and workshop in Room J, 2nd Floor
  • Participating Division: Advanced Semiconductor Test

Please add this workshop to your calendar.  Register Now

[Subject]:

(WS-J) Trends of State-of-the-Art Measurement Technology – 06

Seven Reasons Why You Should Choose Multiline TRL for Wafer-Level System Calibration at mm-Wave Frequencies

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation
[Time]: 14:20 – 15:00, Tuesday, November 6