• March 10-12, 2020   
• San Diego Convention Center, CA, USA
• Booth No. 2613  
• Participating Division: Photonics Automation | Thermal

• January 29-31, 2020 
• Tokyo Big Sight, Japan
• Booth No. 2W-T12
• Participating Division: Photonics Automation

• January 27-28, 2020
• Grand Hyatt San Antonio, TX, USA
• Booth No. 111
• Participating Division: Advanced Semiconductor Test

Please add this program to your calendar. ⇒ Register Now

[Subject]: On-Wafer System Calibration for mm-Wave Frequency Applications

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation, and Dr. Marco Spirito, Delft University of Technology.

[Time]:
08:00 – 17:00: NIST/ARFTG Short Course, Sunday, January 26
08:00 – 12:00: NIST/ARFTG Short Course, Monday, January 27

[Venue]: Room Travis AB

[Subject]: How to Design Your Own on-Wafer Calibration Standards and Why You Should Do It

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation, and Dr. Marco Spirito, Delft University of Technology.

[Time]: 11:15 – 12:00: Workshop on Advanced Measurements for RF Silicon, Wednesday, January 29

[Venue]: Republic B

[Subject]: Calibration Substrate Design for Accurate mm-Wave Probe-Tip Calibration

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation; Ralf Doerner, Ferdinand-Braun-Institut (FBH), and Gia Ngoc Phung, Ferdinand-Braun-Institut (FBH)

[Time]: 16:10 – 16:30: Conference Presentation, Session B: On-Wafer and mm-Wave Measurements, Monday, January 27

• December 11-13, 2019
• Sands Expo & Convention Centre, Level 4, Marina Bay Sands, Singapore
• Please visit us at Booth No. B4
• Participating Division:  Advanced Semiconductor Test

• November 18-19, 2019   
• Wyboston, UK   
• Participating Division Advanced Semiconductor Test

Please add this program to your calendar. ⇒ Register Now

[Subject]: Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon devices

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation

[Time]: 11:10 – 11:40, Tuesday, November 19

• November 12-15, 2019   
• Messe München, Germany   
• Booth No. B1101   
• Participating Division: Probe Card Technologies | Thermal