•  November 11, 2020

•  On Demand from November 12 to December 3

•  Participating Division: Probe Card Technologies

  Only registered attendee will have access to the technical programs and the expo. Register Now.

   

  High-speed PCB electrical characterization with good stability and repeatability

  Presented by Adolph Cheng, MPI Corporation

  15:30 – 16:30, November 11, 2020 (PDT)

• September 23-25, 2020
• Venue: TaiNEX 1(台北南港展覽館一館), Taipei, Taiwan
• Booth No. K2360
• Participating Division: Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test

• September 14-18, 2020
• Participating Division: Advanced Semiconductor Test
• Register here for ISPSD2020 conference and chat with us during Break and Exhibition.
• View MPI Virtual Booth: https://www.ispsd2020.com/exhibitor/11

• Aug 4-6, 2020
• Participating Divisions: Advanced Semiconductor Test | Thermal Test

Please note: Only registered attendees will be able to access the virtual event, on demand content and exhibition. ⇒ Register Now

Registration for attendee registration will close on September 25th at midnight Hawaii time. The Exhibition is open until September 30th.

[Subject]: Addressing Calibration and Measurement Challenges of Broadband On-wafer VNA Measurements up to 220 GHz

[Presenter]: Steve Reyes & Dr. Jon Martens, Anritsu Company, Dr. Andrej Rumiantsev, MPI Corporation

• July 16-17, 2020                                             
• Participating Division: Advanced Semiconductor Test