• November 18-19, 2019   
• Wyboston, UK   
• Participating Division Advanced Semiconductor Test

Please add this program to your calendar. ⇒ Register Now

[Subject]: Your recipe of on-wafer calibration for accurate mm-wave characterisation of advanced silicon devices

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation

[Time]: 11:10 – 11:40, Tuesday, November 19

• November 12-15, 2019   
• Messe München, Germany   
• Booth No. B1101   
• Participating Division: Probe Card Technologies | Thermal

• November 7, 2019     
• Cambridge, UK     
• Participating Division Advanced Semiconductor Test

• November 4-6, 2019     
• Tel Aviv, Israel     
• Please visit us at Booth No. 72
• Participating Division Advanced Semiconductor Test

Please add this program to your calendar. ⇒ Register Now

[Subject]: Recent Advances in mm-wave Characterization, Calibration and de-embedding techniques

[Presenter]: Dr. Andrej Rumiantsev, MPI Corporation

[Time]: 09:30 – 10:00, Wednesday, November 6

• October 17-18, 2019
• Hsinchu Sheraton Hotel, Taiwan
• Please visit us at Booth No. 510
• Participating Division: Probe Card Technologies

• October 16-18, 2019
• TaiNEX 1, Taipei, Taiwan
• Please visit us at Booth No. M332
• Participating Division: Photonics Automation