• Virtual Exhibition: January 12-14, 2021
• Exhibition Hours (Central European Standard Time Zone)

08:30 to 12:30 (Asia focused)

08:30 to 18:00 (Europe focused)

13:00 to 18:00 (US focused)

18:00 to 21:00 (Optional time for dedicated appointments)

• On Demand until February 5, 2021
• Participating Division: Advanced Semiconductor Test
• Register for FREE as an exhibition only Visitor: Register Now

Please add these programs to your calendar.

WORKSHOPS AND SHORT COURSES – WS-07 Sub-mmWave On-Wafer Measurements

【Subject】A practical guide for verifying on-wafer measurement system integrity at sub-mm-wave frequencies

【Presenters】Ralf Doerner, Ferdinand-Braun-Institut(FBH); Andrej Rumiantsev, MPI Corporation

【Time】08:30 – 17:50, Sunday, January 10

INDUSTRY KEYNOTE – EuMC51-1

【Subject】Broadband Wafer-Level Characterization of Next-Generation Semiconductors: Requirements, Challenges, and Solutions

【Presenters】Andrej Rumiantsev, MPI Corporation

【Time】10:50 – 11:10, Thursday, January 14

•  November 11, 2020

•  On Demand from November 12 to December 3

•  Participating Division: Probe Card Technologies

  Only registered attendee will have access to the technical programs and the expo. Register Now.

   

  High-speed PCB electrical characterization with good stability and repeatability

  Presented by Adolph Cheng, MPI Corporation

  15:30 – 16:30, November 11, 2020 (PDT)

• September 23-25, 2020
• Venue: TaiNEX 1(台北南港展覽館一館), Taipei, Taiwan
• Booth No. K2360
• Participating Division: Probe Card Technologies | Photonics Automation | Advanced Semiconductor Test | Thermal Test

• September 14-18, 2020
• Participating Division: Advanced Semiconductor Test
• Register here for ISPSD2020 conference and chat with us during Break and Exhibition.
• View MPI Virtual Booth: https://www.ispsd2020.com/exhibitor/11

• Aug 4-6, 2020
• Participating Divisions: Advanced Semiconductor Test | Thermal Test

Please note: Only registered attendees will be able to access the virtual event, on demand content and exhibition. ⇒ Register Now

Registration for attendee registration will close on September 25th at midnight Hawaii time. The Exhibition is open until September 30th.

[Subject]: Addressing Calibration and Measurement Challenges of Broadband On-wafer VNA Measurements up to 220 GHz

[Presenter]: Steve Reyes & Dr. Jon Martens, Anritsu Company, Dr. Andrej Rumiantsev, MPI Corporation