Wafer Probe |  Micropositioners  | Manual Probe Station |  Probe Station |  On Wafer Probe Station | Manual Probe Station | Manual Probe Station  

 

[et_pb_blurb_extended admin_label="Device Characterization Extended" title="Device Characterization" url="/ast/applications/device-characterization/" image="/wp-content/uploads/2019/02/Device-Characterization_2-1.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="4.0.6" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/device-characterization/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 3;||right: 3;||bottom: 3;||left: 3;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|phone" header_font_size_phone="6px" custom_margin_phone="-20px||-7px|" custom_margin_last_edited="on|tablet" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|desktop" read_more_text_shadow_horizontal_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_horizontal_length_tablet="0px" read_more_text_shadow_vertical_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_vertical_length_tablet="0px" read_more_text_shadow_blur_strength="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_blur_strength_tablet="1px" header_text_shadow_horizontal_length="header_text_shadow_style,%91object Object%93" header_text_shadow_horizontal_length_tablet="0px" header_text_shadow_vertical_length="header_text_shadow_style,%91object Object%93" header_text_shadow_vertical_length_tablet="0px" header_text_shadow_blur_strength="header_text_shadow_style,%91object Object%93" header_text_shadow_blur_strength_tablet="1px" body_text_shadow_horizontal_length="body_text_shadow_style,%91object Object%93" body_text_shadow_horizontal_length_tablet="0px" body_text_shadow_vertical_length="body_text_shadow_style,%91object Object%93" body_text_shadow_vertical_length_tablet="0px" body_text_shadow_blur_strength="body_text_shadow_style,%91object Object%93" body_text_shadow_blur_strength_tablet="1px" box_shadow_horizontal_tablet="0px" box_shadow_vertical_tablet="0px" box_shadow_blur_tablet="40px" box_shadow_spread_tablet="0px" z_index_tablet="500" /][et_pb_blurb_extended admin_label="High Power Extended" title="High Power" url="/ast/applications/high-power/" image="https://www.mpi-corporation.com/wp-content/uploads/2019/01/Application_High-Powerblurb.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="4.0.6" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/high-power/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 0;||right: 0;||bottom: 0;||left: 0;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|phone" header_font_size_phone="6px" custom_margin_phone="-20px||-7px|" custom_margin_last_edited="on|phone" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|desktop" read_more_text_shadow_horizontal_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_horizontal_length_tablet="0px" read_more_text_shadow_vertical_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_vertical_length_tablet="0px" read_more_text_shadow_blur_strength="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_blur_strength_tablet="1px" header_text_shadow_horizontal_length="header_text_shadow_style,%91object Object%93" header_text_shadow_horizontal_length_tablet="0px" header_text_shadow_vertical_length="header_text_shadow_style,%91object Object%93" header_text_shadow_vertical_length_tablet="0px" header_text_shadow_blur_strength="header_text_shadow_style,%91object Object%93" header_text_shadow_blur_strength_tablet="1px" body_text_shadow_horizontal_length="body_text_shadow_style,%91object Object%93" body_text_shadow_horizontal_length_tablet="0px" body_text_shadow_vertical_length="body_text_shadow_style,%91object Object%93" body_text_shadow_vertical_length_tablet="0px" body_text_shadow_blur_strength="body_text_shadow_style,%91object Object%93" body_text_shadow_blur_strength_tablet="1px" box_shadow_horizontal_tablet="0px" box_shadow_vertical_tablet="0px" box_shadow_blur_tablet="40px" box_shadow_spread_tablet="0px" z_index_tablet="500" /][et_pb_blurb_extended admin_label="RF-mmW Extended" title="RF-mmW" url="/ast/applications/rf-and-mmw/" image="/wp-content/uploads/2019/02/RF-mmW-2.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="3.29.3" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/rf-and-mmw/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 0;||right: 0;||bottom: 0;||left: 0;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|tablet" header_font_size_phone="8px" custom_margin_last_edited="on|desktop" custom_margin_phone="-20px||-7px|" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|phone" read_more_text_shadow_horizontal_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_horizontal_length_tablet="0px" read_more_text_shadow_vertical_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_vertical_length_tablet="0px" read_more_text_shadow_blur_strength="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_blur_strength_tablet="1px" header_text_shadow_horizontal_length="header_text_shadow_style,%91object Object%93" header_text_shadow_horizontal_length_tablet="0px" header_text_shadow_vertical_length="header_text_shadow_style,%91object Object%93" header_text_shadow_vertical_length_tablet="0px" header_text_shadow_blur_strength="header_text_shadow_style,%91object Object%93" header_text_shadow_blur_strength_tablet="1px" body_text_shadow_horizontal_length="body_text_shadow_style,%91object Object%93" body_text_shadow_horizontal_length_tablet="0px" body_text_shadow_vertical_length="body_text_shadow_style,%91object Object%93" body_text_shadow_vertical_length_tablet="0px" body_text_shadow_blur_strength="body_text_shadow_style,%91object Object%93" body_text_shadow_blur_strength_tablet="1px" box_shadow_horizontal_tablet="0px" box_shadow_vertical_tablet="0px" box_shadow_blur_tablet="40px" box_shadow_spread_tablet="0px" z_index_tablet="500" /][et_pb_blurb_extended admin_label="Design Validation Extended" title="Design Validation" url="/ast/applications/design-validation/" image="https://www.mpi-corporation.com/wp-content/uploads/2019/01/Design-Validation-and-IC-Engineering-sm.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="4.0.9" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/design-validation/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 0;||right: 0;||bottom: 0;||left: 0;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|phone" header_font_size_phone="6px" custom_margin_phone="-20px||-7px|" custom_margin_last_edited="on|desktop" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|desktop" read_more_text_shadow_horizontal_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_horizontal_length_tablet="0px" read_more_text_shadow_vertical_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_vertical_length_tablet="0px" read_more_text_shadow_blur_strength="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_blur_strength_tablet="1px" header_text_shadow_horizontal_length="header_text_shadow_style,%91object Object%93" header_text_shadow_horizontal_length_tablet="0px" header_text_shadow_vertical_length="header_text_shadow_style,%91object Object%93" header_text_shadow_vertical_length_tablet="0px" header_text_shadow_blur_strength="header_text_shadow_style,%91object Object%93" header_text_shadow_blur_strength_tablet="1px" body_text_shadow_horizontal_length="body_text_shadow_style,%91object Object%93" body_text_shadow_horizontal_length_tablet="0px" body_text_shadow_vertical_length="body_text_shadow_style,%91object Object%93" body_text_shadow_vertical_length_tablet="0px" body_text_shadow_blur_strength="body_text_shadow_style,%91object Object%93" body_text_shadow_blur_strength_tablet="1px" box_shadow_horizontal_tablet="0px" box_shadow_vertical_tablet="0px" box_shadow_blur_tablet="40px" box_shadow_spread_tablet="0px" z_index_tablet="500" /][et_pb_blurb_extended admin_label="Failure Analysis Extended" title="Failure Analysis" url="/ast/applications/failure-analysis/" image="/wp-content/uploads/2019/02/Failure-Analysis_2.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="3.29.3" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/failure-analysis/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 0;||right: 0;||bottom: 0;||left: 0;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|phone" header_font_size_phone="6px" custom_margin_last_edited="on|desktop" custom_margin_phone="-20px||-7px|" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|desktop" read_more_text_shadow_horizontal_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_horizontal_length_tablet="0px" read_more_text_shadow_vertical_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_vertical_length_tablet="0px" read_more_text_shadow_blur_strength="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_blur_strength_tablet="1px" header_text_shadow_horizontal_length="header_text_shadow_style,%91object Object%93" header_text_shadow_horizontal_length_tablet="0px" header_text_shadow_vertical_length="header_text_shadow_style,%91object Object%93" header_text_shadow_vertical_length_tablet="0px" header_text_shadow_blur_strength="header_text_shadow_style,%91object Object%93" header_text_shadow_blur_strength_tablet="1px" body_text_shadow_horizontal_length="body_text_shadow_style,%91object Object%93" body_text_shadow_horizontal_length_tablet="0px" body_text_shadow_vertical_length="body_text_shadow_style,%91object Object%93" body_text_shadow_vertical_length_tablet="0px" body_text_shadow_blur_strength="body_text_shadow_style,%91object Object%93" body_text_shadow_blur_strength_tablet="1px" box_shadow_horizontal_tablet="0px" box_shadow_vertical_tablet="0px" box_shadow_blur_tablet="40px" box_shadow_spread_tablet="0px" z_index_tablet="500" /][et_pb_blurb_extended admin_label="Wafer Level Reliability Extended" title="Wafer Level Reliability" url="/ast/applications/wlr/" image="/wp-content/uploads/2019/01/Wafer-Level-Reliability-SM.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="3.29.3" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/wlr/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 0;||right: 0;||bottom: 0;||left: 0;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|phone" header_font_size_phone="6px" custom_margin_phone="-20px||-7px|" custom_margin_last_edited="on|phone" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|phone" read_more_text_shadow_horizontal_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_horizontal_length_tablet="0px" read_more_text_shadow_vertical_length="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_vertical_length_tablet="0px" read_more_text_shadow_blur_strength="read_more_text_shadow_style,%91object Object%93" read_more_text_shadow_blur_strength_tablet="1px" header_text_shadow_horizontal_length="header_text_shadow_style,%91object Object%93" header_text_shadow_horizontal_length_tablet="0px" header_text_shadow_vertical_length="header_text_shadow_style,%91object Object%93" header_text_shadow_vertical_length_tablet="0px" header_text_shadow_blur_strength="header_text_shadow_style,%91object Object%93" header_text_shadow_blur_strength_tablet="1px" body_text_shadow_horizontal_length="body_text_shadow_style,%91object Object%93" body_text_shadow_horizontal_length_tablet="0px" body_text_shadow_vertical_length="body_text_shadow_style,%91object Object%93" body_text_shadow_vertical_length_tablet="0px" body_text_shadow_blur_strength="body_text_shadow_style,%91object Object%93" body_text_shadow_blur_strength_tablet="1px" box_shadow_horizontal_tablet="0px" box_shadow_vertical_tablet="0px" box_shadow_blur_tablet="40px" box_shadow_spread_tablet="0px" z_index_tablet="500" /][et_pb_blurb_extended admin_label="Silicon Photonics Extended" title="Silicon Photonics" url="/ast/applications/silicon-photonics-on-wafer-test/" image="https://www.mpi-corporation.com/wp-content/uploads/2019/02/Silicon-Photonics-1.jpg" image_max_width="550px" title_hover_color="#f6aa00" _builder_version="3.21" header_text_color="#ffffff" header_font_size="14px" border_radii="on|5px|5px|5px|5px" text_orientation="center" background_layout="dark" custom_margin="-15px|||" custom_padding="|4px|0px|4px" link_option_url="/ast/applications/silicon-photonics-on-wafer-test/" custom_css_blurb_image="border: #ffffff solid 1px;||top: 0;||right: 0;||bottom: 0;||left: 0;||" custom_css_blurb_title="margin-top: -25px !important;" fb_front_background_color="#ffffff" fb_back_background_color="#ffffff" shape_color="#2ea3f2" shape_border_color="#2ea3f2" animation="off" header_font_size_tablet="10px" header_font_size_last_edited="on|phone" header_font_size_phone="6px" custom_margin_phone="-20px||-7px|" custom_margin_last_edited="on|desktop" custom_padding_tablet="|2px|0px|2px" custom_padding_last_edited="on|phone" /]

MPI TS50 – The University Talent

MPI TS50 – The University Talent

The MPI TS50 manual probe system has been specifically designed for IC Engineering, Single Die probing and academic use in DC/CV and RF measurement applications. The TS50 with the small footprint (300 x 300 mm) is engineered to its simplest form to allow convenient operation and providing quick set-up without compromising functionality and measurement capability.

MPI IMPACT™ Test Solutions for Education

MPI IMPACT™ Test Solutions for Education

MPI TS150, TS200 & TS300

MPI TS150, TS200 & TS300

Probe System | Probe Station | 300mm Probe Station | 300mm Probing System | Manual Probe System

MPI TS150, TS200 & TS300 each incorporate many exciting features which make daily operation much simpler.  The features are easy, intuitive, convenient and ensure highly accurate measurements.

MPI TS150-THZ Probe System

MPI TS150-THZ Probe System

TS150-THZ Wafer Probe System | Wafer Probing System | 150mm Probe Station | 150mm Prober

With significant expansion of emerging THz applications, such as high-speed 5G communication, satellites, non-invasive spectroscopy, security and surveillance, medical and health care equipment, and short range automotive radar, the need for accurate, reliable and repeatable measurement data has become more crucial than ever. This is especially true for the research and technology development of the devices, integrated circuits and new product building blocks serving the need of these THz applications.

The MPI TS150-THZ is the first, worldwide 150 mm dedicated probe station designed explicitly for mmW and THz on-wafer measurements up to 1.5 THz and beyond. It provides unsurpassed features:

  • Seamless integration of any banded, differential or broadband frequency extenders up to 1.5 THz
  • Maximum on mechanical stability and repeatability combined with convenient and safety operation
  • Minimizing the measurement path for best possible measurement directivity,

MPI TS150-AIT & TS200-THZ

MPI TS150-AIT & TS200-THZ

TS150-AIT and TS200-THZ Probe Systems

TS150-AIT and TS200-THZ probe systems expand MPI one-of-a-kind system solutions for emerging THz applications such as high-speed 5G communication, satellites, non-invasive spectroscopy, security and surveillance, medical and health care equipment, and short range automotive radar by adding active impedance tuner integrations on the same probe stations. These two systems are the industry’s first explicitly designed 150 mm and 200 mm probe systems providing accurate tests for the combination of requirements for mm-wave, THz, and automated impedance tuner applications with best possible measurement directivity.

  • Seamless integration of any banded, differential or broadband frequency extenders up to 1.5 THz and/or automated impedance tuners
  • Novel design of extenders/tuners integration for maximum of measurement dynamic
  • Maximum on mechanical stability and repeatability combined with convenient and safety operation

MPI TS200-SE Probe System

MPI TS200-SE Probe System

TS200-SE Probe System

The MPI TS200-ShielDEnvironment™ (TS200-SE) is designed to ensure advanced EMI/RFI/light-tight shielding, ultra-low noise, low leakage measurement capabilities in a temperature range from -60 to +300°C.

MPI TS300-SE Probe System

MPI TS300-SE Probe System

300mm Probe System | 300mm Wafer Probing| 300mm Wafer Probe| Wafer Prober | 300mm Wafer Prober

The MPI TS300-ShielDEnvironment™ (TS300-SE) is designed to ensure advanced EMI/RFI/light-tight shielding, ultra-low noise, low leakage measurement capabilities on 300 mm wafer in a temperature range from -60 to +300°C.

It’s incorporated with vibration isolation table at optimal height to make the daily operation very convenient.

MPI TS2000 Series – The Evolution

MPI TS2000 Series – The Evolution

200mm Automatic Probe System | Automatic Probe Station | Probe Station | Wafer Probe Station | 200mm Automated Probe Station

Recognize the Difference

MPI TS2000 is a natural evolution of the world-wide and well established Probe System with dedicated designs addressing Advanced Semiconductor Test market requirements. The system is fully compatible with the all MPI system accessories and is designed primarily to address of Failure Analysis, Design Verification, IC engineering, Wafer Level Reliability as well as special requirements for MEMS, High Power, RF and mmW device testing.

Available for ambient and/or hot only temperature operation modes the TS2000 is fast with speed up to 10 Dies/second (depends on the final configuration), which makes it an ideal choice for pre-production electrical tests on discrete RF devices, as example.

MPI TS2000-SE – The Future Starts Now

MPI TS2000-SE – The Future Starts Now

200mm Automatic Probe System | Automatic Probe Station | Probe Station | Wafer Probe Station | 200mm Automated Probe Station

Measure the Difference

The TS2000-SE from MPI is the first ever 200mm automated engineering probe system on the market integrating innovative features specifically designed to reduce the cost of test. These features are incorporated into the MPI ShielDEnvironment™ for ultra-low noise, very accurate and highly reliable DC/CV, RF and High Power measurements.

MPI TS3000 Automated Probe System

MPI TS3000 Automated Probe System

300mm Automatic Probe System | 300 mm Probe System | 300 mm Probe Station | Automatic Probe Station | Probe Station | Wafer Probe Station

The TS3000 from MPI is an automated 300 mm probe system, specifically designed for Product Engineering, Failure Analysis, Design Validation, Wafer Level Reliability and RF & mmW applications.

The TS3000 feature set provides:

  • Maximum on temperature range -60…300°C
  • Maximum on flexibility
  • Minimum cable distance to functional testers with a design specific cable interface for better measurement directivity
  • Minimum platen-to-chuck height for optimal mmW & internal node probing
  • Minimum system footprint which integrates the thermal system’s chiller “inside”

which combined together make the TS3000 probe station unique to MPI Corporation and to the product engineering market.

MPI TS3000-SE – with ShielDEnvironment™

MPI TS3000-SE – with ShielDEnvironment™

300mm Automatic Probe Station | 300mm Automatic Probe System | Automatic Probe Station | Automatic Probe System | Wafer Probe Station

The TS3000-SE is the consequent further development of the TS3000 probe system equipped with MPI ShielDEnvironment™ for ultra-low noise, extremely accurate and highly reliable DC/CV, 1/f, RTS and RF measurements, addressing primarily the needs of the Device CharacterizationWafer Level Reliability and RF & mmW applications.

The exclusive, actively cooled probe platen design provides maximal stability over the wide temperature range from -60° to 300°C and is making the TS3000-SE probe system an excellent choice for testing devices under different thermal conditions.

MPI TS3000-SiPH Automated Probe System

MPI TS3000-SiPH Automated Probe System

TS3000-SiPH Automatic Probe Station

The TS3000-SiPH from MPI is an automated 300 mm probe system, specifically designed for characterizing silicon photonics devices.

The TS3000-SiPH feature set provides:

  • High precision fiber alignment systems with maximum flexibility for single or fiber arrays in a dual or single positioner setup
  • Safest operation by including wafer to fiber proximity detection and fiber collision prevention
  • Recommended device test temperature from -40…100°C; System capability -60…300°C
  • Minimizing the system footprint by integrating additional silicon photonics instrumentation in a dedicated measurement shelf

MPI High Power Manual Probe Systems

MPI High Power Manual Probe Systems

High Power Manual Probe Systems | Manual Probe Stations | High Power Probe Station | Wafer Probing Station | 150 mm Wafer Prober | 200 mm Wafer Prober | Manual Probe System

MPI High-Power device characterization systems are specifically designed for on-wafer high power device testing. MPI TS150-HP and TS200-HP probe systems provide a complete 150 mm and 200 mm on-wafer solution. They are engineered to achieve low contact resistance measurements of power semiconductor under wide range of temperatures.

TS2000-DP – DarkBox High Power Solution

TS2000-DP – DarkBox High Power Solution

300mm Automatic Probe Station

With TS2000-DP, MPI is offering a versatile and cost-effective probe station for on-wafer high power device measurement in temperature range from 20°C  to 300°C, and measurement capability up to 3 kV (triaxial) / 10 kV (coaxial) and 600 A (pulsed).

TS2000-HP –  Advanced High Power Solution

TS2000-HP –  Advanced High Power Solution

300mm Automatic Probe Station

MPI’s automated TS2000-HP provides reliable on-wafer high power device measurement over wide-temperature range and measurement capability up to 3 kV (triax) / 10 kV (coax) and 600 A (pulsed). Advanced ShielDEnvironment™ offers low-noise and shielded test environment.

TS2500-RF – The First Fully Automatic Probe System Dedicated for RF Production Test

TS2500-RF – The First Fully Automatic Probe System Dedicated for RF Production Test

TS2500-RF | Automatic Probe System | Automatic Probe Station | Wafer Probe Station | 300mm Automatic Probe Station

MPI Corporation has quickly become the innovation leader in our served markets by introducing more than a dozen new products in a span of less than two years.

The latest product innovation of MPI is a fully automatic probe system dedicated to Radio Frequency (RF) production test. The system is compatible with all MPI system accessories and is designed specifically to address the need for advanced RF device testing at the production level.

TS3500 Series with WaferWallet™ = Accuracy + Flexibility + Automation

TS3500 Series with WaferWallet™ = Accuracy + Flexibility + Automation

MPI TS3000-SE – with ShielDEnvironment™

TS3500 and TS3500-SE are equivalent in features to MPI’s well-known and established TS3000 and TS3000-SE 300 mm probe stations with the added fully-automated capability by configuring or upgrading with MPI’s unique WaferWallet™. MPI’s solution is lowering the customer’s overall cost-of-test by providing full automation for less than other vendor’s semi-automated products.

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