Semi Automatic Probe Stations

Probe Stations

200mm Probe Station

Wafer Prober

Automated Probe Station

Silicon Photonics Probe Station

Semi Automatic Wafer Prober

Wafer Probing

Automated Probe Systems

Electrical Probe Station

Vacuum Probe System

Wafer Probing System

Semi Automatic Wafer Prober

TS2000-IFE Series – THZ Selection

TS2000-IFE Configured with MPI THZ-Selection

The MPI TS2000-IFE THZ-Selection is based on MPI’s most versatile 200 mm platform TS2000-IFE and converts it into a dedicated, RF, mmW, THZ and load-pull probe station, as first one on the market without compromising measurement directivity and accuracy at wide temperature range from -60°C to +300°C.

Automated testing of 200 mm wafers by:

  • Eliminating the need for additional s-bend waveguides, especially in sub-THz or THz range,
  • Minimizing the signal path for load-pull application and offering the widest tuning range and highest Gamma,
  • Easy and convenient operation and changing between frequency bands,

THZ-Selection incorporates MPI’s innovative design of frequency extender’s integration, developed initially for TS200-THZ, which hovers the extender over the entire 200 mm wafer.

For more details click here.