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LCD Driver Probe Card | LCD Driver Probe Card | Cantilever Probe Cards | Vertical Driver Probe Card | LCD Driver Probe Card | Probe Cards | Cantilever Probe Cards
Low Leakage (WAT)
MPI has strong RD teams in parametric measure to support foundry fabrication both engineering and production wafer test. MPI’s WAT probe card is the possibility of high performance to address ultra low leakage and low capacitance requirements at the same time.
Low Leakage Features include:
- Ultra low leakage