Events Archives - Page 4 of 7 - MPI Corporation

ARFTG 87th Microwave Measurement Conference

May 2nd, 2016|Events|

IEEE MTT-S International Microwave Symposium 2016

May 2nd, 2016|Events|

The 25th Intl. Optoelectronics Exposition (Opto Taiwan 2016)

MPI cordially invites you to visit our booth at Opto Taiwan 2016 to be held from June 15-17, 2016 in Taipei, Taiwan.

You can have a better understanding of MPI products by meeting and discussing with our most experienced experts. We are more than happy to discuss solutions and offer MPI products combined with technical advancements that will surely help you maximize productivity and profitability.

If you have any questions or require further assistance, feel free to contact Ms. Lila Lee through email

We look forward to welcoming you at Opto Taiwan 2016 in Taipei.

Event Details:

April 8th, 2016|Events, PA-News|


  • Exhibition on May 10-11, 2016
  • Paradise Point Resort, San Diego, California
  • Please visit us at Booth No.5
  • Participating Division: Probe Card Technologies
  • Exhibition on May 18, 2016
  • Sheraton Hsinchu Hotel, Taiwan (3F,Ball room I )
  • Please visit us at Booth  No.5
  • Participating Division: Probe Card Technologies
March 9th, 2016|Events, PCBU-News & Events|

SEMICON Southeast Asia 2016

Technical Presentation:

[Presentation]: Rolling Up Solutions of Wafer Probing Technologies.
[Presenter]: Joey Wu, Manager, Global Marketing
[Download]: Full Presentation Here
December 10th, 2015|Events, PCBU-News & Events|

Rohde & Schwarz Technical Workshop in Moscow

  • April 12 -13, 2016
  • Rohde & Schwarz RUS OOO (Office Moscow)
  • Please come join the joint-workshop at Pavlovskaya street, b7, str.1, 5th floor Business Center Pavlovskiy

This workshop is being held in corporation with Rohde & Schwarz RUS OOO. → Register Now

[Subject:] Specifics of the wafer-level measurements and RF calibration based on planar transmission lines
[Abstract:]In this talk we will review specifics of the planar transmission lines such as dispersion and the frequency depended characteristic impedance. Detailed understanding of these phenomena is the key success factor for achieving accurate wafer-level calibration and measurement results. Special attention will be given to definition of the traveling waves, pseudo-waves in planar lines, pseudo S-parameters as well as to the calibration reference impedance of the wafer-level multiline Thru-Reflect-Line (TRL). The theoretical part will be supported by the CST-simulated data and by the measurement data obtained on an integrated RF Probe System.
[Presenter:]Dr. Andrej Rumiantsev
[Time:]15:30, Wednesday, April 13, 2016
December 10th, 2015|Events|

29th IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • March 28 – 31, 2016
  • Hotel Mielparque Yokohama, Kanagawa, Japan
  • Please visit us in Hall Etoile/Cherie, 2F
  • Participating Division: Advanced Semiconductor Test
December 10th, 2015|Events|

ElectronTechExpo 2016

  • March 15 – 17, 2016
  • Crocus Expo, Moscow, Russia
  • Please visit us at Booth No. A423, Pavilion 2
  • Participating Division: Advanced Semiconductor Test
December 10th, 2015|Events|


MPI Semicon China 2016
December 10th, 2015|Events, PCBU-News & Events|

Asia-Pacific Microwave Conference 2015

  • Exhibition on December 7 – 9, 2015
  • Jinling Hotel Nanjing, Nanjing, China (南京金陵飯店新大樓)
  • Please visit us at Booth No. 315, Kunlun Ballroom, 2F (崑崙)
October 27th, 2015|Events|