Events Archives - Page 4 of 7 - MPI Corporation


  • Exhibition: September 12 – 15, 2016; Workshop: September 12, 2016
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please visit our booth and join the workshop at Room 2A
  • Participating Division: Advance Semiconductor Test
R&S / MPI Workshop: Cutting-Edge Modeling and Measurement Techniques Addressing Challenges of 5G Circuits and Systems
This workshop is held in corporation with Rohde & Schwarz.

[Subject]:Wafer-Level Calibration and Measurements at mm-Wave Frequencies
[Abstract]:Accurate calibration of the entire wafer-level measurement system to the RF probe tip end or to the intrinsic device terminals is a critical success factor for extracting trustable device model parameters and characterizing true performance of a RF IC. This presentation will start with the basics of S-parameter measurement and calibration techniques at the wafer-level. Special attention will be paid to how to choose the right calibration method for specific measurement application needs. Finally, the potential sources of calibration residual errors will be analyzed. Practical examples will be given on how to minimize the impact of such errors on the measurement accuracy of a calibrated probe system.
[Presenter]:Dr. Andrej Rumiantsev
[Time]:10:40 – 11:30, Monday, September 12, 2016
September 2nd, 2016|Events|

SEMICON Taiwan 2016

  • Exhibition on September 07 – 09, 2016
  • Taipei Nangang Exhibition Center, Taipei, Taiwan
  • Please visit us at Booth No. 2522.
  • Participating Division: Thermal Test
September 2nd, 2016|Events|

High Frequency/Speed Layout Seminar

  • Exhibition: August 22, 2016 (12:50~16:00)
  • No.22, Jhonghua Rd., Hukou Township, Hsinchu County, Taiwan
  • Please visit us at Hsinchu Industrial Park Service Center , Convention Room
  • Participating Division: Probe Card Technologies
August 22nd, 2016|Events, PCBU-News & Events|

The 28th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

  • June 12-16, 2016
  • Žofín Palace, Prague, Czech Republic
  • Please visit us at Booth No. 21 on Level 2
  • Participating Division: Advanced Semiconductor Test
June 17th, 2016|Events|

IEEE Semiconductor Wafer Test Workshop

  • June 5 – 8, 2016
  • Rancho Bernardo Inn, San Diego, CA, USA
  • Please visit us at Booth No. 2.
[Presentation]: A Customized Additional Advanced

Loopback technology on Vertical Probe Card

[Presenter]: Alex Wei
[Date]: Wednesday, June 08, 2016
May 4th, 2016|Events, PCBU-News & Events|

ARFTG 87th Microwave Measurement Conference

May 2nd, 2016|Events|

IEEE MTT-S International Microwave Symposium 2016

May 2nd, 2016|Events|

The 25th Intl. Optoelectronics Exposition (Opto Taiwan 2016)

MPI cordially invites you to visit our booth at Opto Taiwan 2016 to be held from June 15-17, 2016 in Taipei, Taiwan.

You can have a better understanding of MPI products by meeting and discussing with our most experienced experts. We are more than happy to discuss solutions and offer MPI products combined with technical advancements that will surely help you maximize productivity and profitability.

If you have any questions or require further assistance, feel free to contact Ms. Lila Lee through email

We look forward to welcoming you at Opto Taiwan 2016 in Taipei.

Event Details:

April 8th, 2016|Events, PA-News|


  • Exhibition on May 10-11, 2016
  • Paradise Point Resort, San Diego, California
  • Please visit us at Booth No.5
  • Participating Division: Probe Card Technologies
  • Exhibition on May 18, 2016
  • Sheraton Hsinchu Hotel, Taiwan (3F,Ball room I )
  • Please visit us at Booth  No.5
  • Participating Division: Probe Card Technologies
March 9th, 2016|Events, PCBU-News & Events|

SEMICON Southeast Asia 2016

Technical Presentation:

[Presentation]: Rolling Up Solutions of Wafer Probing Technologies.
[Presenter]: Joey Wu, Manager, Global Marketing
[Download]: Full Presentation Here
December 10th, 2015|Events, PCBU-News & Events|