- Exhibition on December 7 – 9, 2015
- Jinling Hotel Nanjing, Nanjing, China (南京金陵飯店新大樓)
- Please visit us at Booth No. 315, Kunlun Ballroom, 2F (崑崙廳)
- December 1 – 4, 2015
- Georgia Tech Hotel and Conference Center, Atlanta, Georgia
- Please come join the short course in Room Conference B
|[Subject:]||On Wafer S-Parameters & Uncertainties|
|[Abstract:]||Wafer-level S-parameter measurement at mm-wave and sub-mm wave frequencies plays a crucial role in the model development and IC design verification and debug of advanced semiconductor technologies. Accurate calibration of the entire wafer-level measurement system to the RF probe tip end or to the intrinsic device terminals is a critical success factor for extracting trustable device model parameters and characterizing true performance of a RF IC. This presentation will start with the basics of S-parameter measurement and calibration techniques at wafer-level. Special attention will be paid to how to choose the right calibration method for specific measurement application needs. Definition of the calibration reference plane and the measurement reference impedance of a calibrated system will be reviewed as well. Finally, the potential sources of calibration residual errors will be analyzed. Practical examples will be given on how to minimize the impact of such errors on the measurement accuracy of a calibrated probe system.|
|[Presenter:]||Dr. Andrej Rumiantsev|
|[Time:]||13:50 – 14:40, Tuesday, December 1st, 2015|
- November 27, 2015
- Grand Hi-Lai Hotel, Kaohsiung, Taiwan (高雄漢來飯店)
- Please come join thejoint-workshop in Room Golden Phoenix, 9F (金鳳廳)
|[Subject:]||Relentless Innovations for un-compromising measurement accuracy of sub-mm wave IC's at the wafer-level|
|[Abstract:]||Challenges when obtaining accurate, reliable and repeatable measurement results of sub-mm wave ICs at the wafer-level drastically increases with the frequency. Complexity of the measurement setup and its calibration, the need for data obtained for multiple frequency bands and unacceptably high signal loss in transmission media push for relentless innovations.
In this presentation, we will discuss new approaches of integration a sub-millimetre wave VNA with the probe system into a complete measurement solution. The unique design of the probe system enabled highest possible measurement dynamic range without compromising on mechanical stability, as well as simple and fastest system reconfiguration for different frequency bands. Special attention will be given to the system calibration and solutions for eliminating complexity of the calibration task, reducing mistakes and minimising calibration residual errors.
|[Presenter:]||Dr. Andrej Rumiantsev (Co-Presenter: Cyrus Chiu)|
|[Time:]||13:20 - 14:20, Friday, November 27th, 2015|
5th International Workshop on Epitaxial Growth and Fundamental Properties of Semiconductor Nanostructures (SemiconNano)
- Exhibition on September 9 – 10, 2015
- Lakeshore Hotel, Hsinchu City, Taiwan
- September 8 – 10, 2015
- Palais Des Congrès de Paris, Paris, France
- Please visit us at Booth No. 237.
- September 2 – 4, 2015
- TWTC Nangang Exhibition Hall, Taipei, Taiwan
- Please visit us at Booth No. 2522.
- June 23 – 25, 2015
- Middle East Technical University, Ankara, Turkey
- Please visit us at Cultural and Convention Center.
MPI Corporation is honored to announce our participation in the 25th annual Semiconductor Wafer Test Workshop starting June 7th, 2015 at the Rancho Bernardo Inn, San Diego, CA.
On Monday afternoon, MPI’s Alex Wei will present a 12Gbps loopback solution for high speed digital test applications along with perspectives presented at the panel discussion by Rob Carter on Cantilever developments for improved cost-effective tests and longevity.
Of course your SWTW visit would not be complete without seeing us face-to-face so please don’t forget to stop by MPI’s booth to receive the most up to date information on how MPI can help your organization be more competitive.
Please add the following to your calendar：
- Technical Presentation：
Subject： An innovative Design & Implement of Vertical Probe Card for Hi-Speed Loopback (12Gbps) Application Presenter： Alex Wei, Section Manager, R&D Division. Time： 1.00 PM, Monday, Aragon Conference Room
- Panel Discussion: [Title, Panelist, Subject Brief Description ]
Subject： Panel 1: How Will Cantilever Go Further?
Panel 2: High Parallel Micro Bump Probing, Is There A Real Need? What Would Be The Challenges?
Panelist： Rob Carter, VP of Corporate Marketing, MPI Time： 3.30 PM, Monday, Aragon Conference Room
- MPI Exhibition: [Booth #]
Booth #： Number 2, near to entrance of Expo Hall. Time： Open from 5.00 PM, Monday
MPI Corporation was founded in July, 1995 and has enjoyed growth well beyond industry standards due to an infusion between customer centricity, industry leading technology development, advanced manufacturing techniques and world class customer support. MPI’s four main product lines include state of the art Wafer Test Probe Cards, Production LED Equipment, Advanced Semiconductor Test Equipment and Thermal Air solutions. The industries MPI serves include Semiconductor, Materials Research, Aerospace, Automotive, Fiber Optic, Electronic Components, Bio-Research, and more. Cross pollination of product technologies allows each new innovation to provide differentiation in areas that are meaningful to the markets we serve. MPI is the only publically owned, GTSM-listed company of its kind in Taiwan. For more information visit www.mpi-corporation.com
- Press Contactor:Nicole Tseng, Marketing Communication,