Events Archives - Page 2 of 6 - MPI Corporation

IEEE MTT-S International Microwave Symposium 2017

March 30th, 2017|Events|

IEEE Semiconductor Wafer Test Workshop

  • June 4-7, 2017
  • Rancho Bernardo Inn, San Diego, CA, USA
  • Please visit us at Booth No. 9
[Presentation]: MEMS process on RF Probe Card
[Presenter]: Alex Wei
[Date]: Wednesday, June 07, 2017
March 14th, 2017|Events, PCBU-News & Events|

The 29th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

  • Exhibition on May 29 – 31,  2017
  • Royton Sapporo, Hokkaido, Japan
  • Please visit us at Booth No. 16, in the Lobby on 3F
  • Participating Division: Advanced Semiconductor Test
March 14th, 2017|Events|

R&S Taiwan & MPI Joint Workshop

  • May 24, 2017
  • Please come join the hands-on and workshop in R&S Taipei Training Center (台北市北投區北投路二段13號13樓)
  • Participating Division: Advanced Semiconductor Test

This workshop is being held in corporation with Rohde & Schwarz Taiwan. Register Now

[Subject:] Critical Success Factors for Wafer-Level Measurements at THz Frequencies
[Abstract:]With significant expansion of emerging THz applications, such as non-invasive spectroscopy, security and surveillance, the need for accurate, reliable and repeatable measurement data has become more crucial than ever. This is especially true for the research and technology development of the devices, integrated circuits and new product building blocks serving the need of THz applications.

This presentation will discuss unique solutions developed by MPI Corporation to address challenges of wafer-level calibration and measurements at THz frequencies, such as: integration of the measurement instrumentation, frequent system reconfiguration, impact of an operator on the accuracy and repeatability of data. Last but not least, the need for metrology-level analysis of the measured data and system calibration will be discussed as well.
[Presenter:]Hawk Liao
[Time:]13:30 - 14:30, Wednesday, May 24th, 2017
March 14th, 2017|Events|

ADVANTEST DEVELOPER CONFERENCE 2017

  • Exhibition on May 16-17, 2017
  • Hyatt Regency Indian Wells Resort & Spa (Indian Wells Ballroom)
  • Please visit us at Booth No.12
  • Participating Division: Probe Card Technologies
  • Exhibition on May 26, 2017
  • Intercontinental Shanghai Pudong
  • Please visit us at Booth No.5
  • Participating Division: Probe Card Technologies
March 14th, 2017|Events, PCBU-News & Events|

Spring MOS-AK Workshop at DATE

  • March 31, 2017
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please come join the first afternoon workshop:
    “New Approach to Reduce Time-to-data when Characterizing Advanced Semiconductor Devices” by Dr. Andrej Rumiantsev
  • Participating Division: Advanced Semiconductor Test
March 13th, 2017|Events|

30th IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • Exhibition on March 28-30, 2017
  • Maison MINATEC, Grenoble, France
  • Please visit us in the room Titane
  • Participating Division: Advanced Semiconductor Test
February 6th, 2017|Events|

SEMICON CHINA 2017

February 6th, 2017|Events, PCBU-News & Events|

Asia-Pacific Microwave Conference 2016

  • Exhibition on December 6-8, 2016
  • Hotel Pullman, Aerocity, New Delhi, India
  • Please visit us in Peacock Ballroom
  • Participating Division: Advanced Semiconductor Test
November 10th, 2016|Events|

R&S 5G Innovation Summit 2016

  • November 29, 2016 in DoubleTree by Hilton San Diego – Del Mar, CA, USA
  • December 1, 2016 in Biltmore Hotel & Suites – Santa Clara, CA, USA
  • Please come join the joint-workshop
  • Participating Division: Advanced Semiconductor Test
An workshop is being held in corporation with Rohde & Schwarz USA. Register Now
November 10th, 2016|Events|