Events Archives - Page 2 of 7 - MPI Corporation

MPI Corporation’s collaboration with htt Group

Taiwan, May 11th, 2017 – MPI Corporation is proud to announce a formal agreement with htt Group for the distribution of MPI’s Probe Card Division products throughout Europe. This agreement includes the installation of equipment, training and personnel for the repair support of MPI’s probe card product lines at htt’s facility in Dresden, Germany….[More]
May 11th, 2017|Events, PCBU-News & Events|

MPI Corporation Opens Subsidiary in U.S.A.

Taiwan, April 15th, 2017 – MPI Corporation is proud to announce the grand opening of its subsidiary MPI America in the United States. MPI has demonstrated clear leadership in recent years developing numerous and very significant innovations while serving customers in the semiconductor test market. MPI continues its leadership position and global expansion with the opening of MPI America, Inc. which includes a fully staffed facility with resources for sales, customer service, field service, repair, and a spare parts depot. Located in San Jose, CA. MPI America is a reflection of MPI Corporation’s commitment to customer centricity and product innovation resulting in meaningful reductions to the cost of semiconductor test….[More]
April 27th, 2017|Events|

SEMICON WEST 2017

April 7th, 2017|Events|

89th ARFTG Microwave Measurement Symposium

March 30th, 2017|Events|

IEEE MTT-S International Microwave Symposium 2017

March 30th, 2017|Events|

IEEE Semiconductor Wafer Test Workshop

  • June 4-7, 2017
  • Rancho Bernardo Inn, San Diego, CA, USA
  • Please visit us at Booth No. 9
[Presentation]: MEMS process on RF Probe Card
[Presenter]: Alex Wei
[Date]: Wednesday, June 07, 2017
March 14th, 2017|Events, PCBU-News & Events|

The 29th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

  • Exhibition on May 29 – 31,  2017
  • Royton Sapporo, Hokkaido, Japan
  • Please visit us at Booth No. 16, in the Lobby on 3F
  • Participating Division: Advanced Semiconductor Test
March 14th, 2017|Events|

R&S Taiwan & MPI Joint Workshop

  • May 24, 2017
  • Please come join the hands-on and workshop in R&S Taipei Training Center (台北市北投區北投路二段13號13樓)
  • Participating Division: Advanced Semiconductor Test

This workshop is being held in corporation with Rohde & Schwarz Taiwan. Register Now

[Subject:] Critical Success Factors for Wafer-Level Measurements at THz Frequencies
[Abstract:]With significant expansion of emerging THz applications, such as non-invasive spectroscopy, security and surveillance, the need for accurate, reliable and repeatable measurement data has become more crucial than ever. This is especially true for the research and technology development of the devices, integrated circuits and new product building blocks serving the need of THz applications.

This presentation will discuss unique solutions developed by MPI Corporation to address challenges of wafer-level calibration and measurements at THz frequencies, such as: integration of the measurement instrumentation, frequent system reconfiguration, impact of an operator on the accuracy and repeatability of data. Last but not least, the need for metrology-level analysis of the measured data and system calibration will be discussed as well.
[Presenter:]Hawk Liao
[Time:]13:30 - 14:30, Wednesday, May 24th, 2017
March 14th, 2017|Events|

ADVANTEST DEVELOPER CONFERENCE 2017

  • Exhibition on May 16-17, 2017
  • Hyatt Regency Indian Wells Resort & Spa (Indian Wells Ballroom)
  • Please visit us at Booth No.12
  • Participating Division: Probe Card Technologies
  • Exhibition on May 26, 2017
  • Intercontinental Shanghai Pudong
  • Please visit us at Booth No.5
  • Participating Division: Probe Card Technologies
March 14th, 2017|Events, PCBU-News & Events|

Spring MOS-AK Workshop at DATE

  • March 31, 2017
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please come join the first afternoon workshop:
    “New Approach to Reduce Time-to-data when Characterizing Advanced Semiconductor Devices” by Dr. Andrej Rumiantsev
  • Participating Division: Advanced Semiconductor Test
March 13th, 2017|Events|