R&S Taiwan & MPI Joint Workshop

May 24, 2017 Please come join the hands-on and workshop in R&S Taipei Training Center (台北市北投區北投路二段13號13樓) Participating Division: Advanced Semiconductor Test This workshop is being held in corporation with Rohde & Schwarz Taiwan. → Register Now [Subject:]...
ADVANTEST DEVELOPER CONFERENCE 2017

ADVANTEST DEVELOPER CONFERENCE 2017

Exhibition on May 16-17, 2017 Hyatt Regency Indian Wells Resort & Spa (Indian Wells Ballroom) Please visit us at Booth No.12 Participating Division: Probe Card Technologies Exhibition on May 26, 2017 Intercontinental Shanghai Pudong Please visit us at Booth No.5...
Spring MOS-AK Workshop at DATE

Spring MOS-AK Workshop at DATE

March 31, 2017 Swisstech Convention Centre, Lausanne, Switzerland Please come join the first afternoon workshop: “New Approach to Reduce Time-to-data when Characterizing Advanced Semiconductor Devices” by Dr. Andrej Rumiantsev Participating Division: Advanced...
SEMICON CHINA 2017

SEMICON CHINA 2017

Exhibition on March 14-16, 2017 New International Expo Centre, ShangHai, China Please visit us at Booth No. 4143-2 Participating Division: Probe Card Technologies | Photonics Automation | Thermal Test | Advanced Semiconductor...