Anderson Wu, Author at MPI Corporation

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So far Anderson Wu has created 41 blog entries.

SEMICON Europa 2017

MPI sincerely invites you to join us and explore a comprehensive range of solutions at this year’s Semicon Europa. If you have any questions or require any assistance, feel free to contact Lila Lee through email

We look forward to meeting you at Semicon Europa!

When & Where

February 8th, 2017|PA-News|

SEMICON China 2017

MPI would like to invite you to visit us at SEMICON China 2017. Our experts will be there to present our newest equipment and probing solutions. If you have any questions or require any assistance, feel free to contact Lila Lee through email

We look forward to welcoming you at Semicon China!

When & Where

February 8th, 2017|PA-News|

30th IEEE International Conference on Microelectronic Test Structures (ICMTS)

  • Exhibition on March 28-30, 2017
  • Maison MINATEC, Grenoble, France
  • Please visit us in the room Titane
  • Participating Division: Advanced Semiconductor Test
February 6th, 2017|Events|


February 6th, 2017|Events, PCBU-News & Events|

The Company is invited to attend Goldman Sachs Taiwan Equipment and Automation Day

Subject: The Company is invited to attend Goldman Sachs Taiwan Equipment and Automation Day

Date of events: 2017/01/17


  1. Date of the investor conference:2017/01/17
  2. Time of the investor conference:15:30
  3. Location of the investor conference:
    Goldman Sachs (Asia) LLC Taipei Metro Tower, 11th Floor 207 Tun Hua South Road Sec. 2, Taipei
  4. Brief information disclosed in the investor conference:Business content and operating result
  5. The presentation of the investor conference release:The presentation will be posted on M.O.P.S
  6. Will the presentation be released in the Company’s website:
  7. Any other matters that need to be specified:None
January 12th, 2017|Investor Conference|

Asia-Pacific Microwave Conference 2016

  • Exhibition on December 6-8, 2016
  • Hotel Pullman, Aerocity, New Delhi, India
  • Please visit us in Peacock Ballroom
  • Participating Division: Advanced Semiconductor Test
November 10th, 2016|Events|

R&S 5G Innovation Summit 2016

  • November 29, 2016 in DoubleTree by Hilton San Diego – Del Mar, CA, USA
  • December 1, 2016 in Biltmore Hotel & Suites – Santa Clara, CA, USA
  • Please come join the joint-workshop
  • Participating Division: Advanced Semiconductor Test
An workshop is being held in corporation with Rohde & Schwarz USA. Register Now
November 10th, 2016|Events|

European Microwave Week 2016

September 2nd, 2016|Events|


  • Exhibition: September 12 – 15, 2016; Workshop: September 12, 2016
  • Swisstech Convention Centre, Lausanne, Switzerland
  • Please visit our booth and join the workshop at Room 2A
  • Participating Division: Advance Semiconductor Test
R&S / MPI Workshop: Cutting-Edge Modeling and Measurement Techniques Addressing Challenges of 5G Circuits and Systems
This workshop is held in corporation with Rohde & Schwarz.

[Subject]:Wafer-Level Calibration and Measurements at mm-Wave Frequencies
[Abstract]:Accurate calibration of the entire wafer-level measurement system to the RF probe tip end or to the intrinsic device terminals is a critical success factor for extracting trustable device model parameters and characterizing true performance of a RF IC. This presentation will start with the basics of S-parameter measurement and calibration techniques at the wafer-level. Special attention will be paid to how to choose the right calibration method for specific measurement application needs. Finally, the potential sources of calibration residual errors will be analyzed. Practical examples will be given on how to minimize the impact of such errors on the measurement accuracy of a calibrated probe system.
[Presenter]:Dr. Andrej Rumiantsev
[Time]:10:40 – 11:30, Monday, September 12, 2016
September 2nd, 2016|Events|

SEMICON Taiwan 2016

  • Exhibition on September 07 – 09, 2016
  • Taipei Nangang Exhibition Center, Taipei, Taiwan
  • Please visit us at Booth No. 2522.
  • Participating Division: Thermal Test
September 2nd, 2016|Events|