ProPlus and MPI Corporation Establish Strategic Partnership, Announce Availability of a Characterization and Modeling Solution

Cross-Licensing Agreement Brings Next-Level Wafer-Level Noise Characterization,
Enabling High Throughput Measurements with Advanced Probing Technologies 

Taiwan, Dec. 12th, 2017 – ProPlus Design Solutions Inc. and MPI Corporation today announced a strategic partnership agreement and immediate availability of a characterization and modeling solution that integrates ProPlus’ SPICE modeling and […]

MPI Corporation Introduces New 300 mm PRIME™ Thermal Chuck Technology

Taiwan, Nov. 14th, 2017 – MPI Corporation has introduced a new 300 mm thermal chuck designated PRIME™ technology for wafer probe stations with full temperature range thermal testing while delivering unsurpassed performance and flexibility.

Continuing the innovative leadership within the engineering probe system market, MPI Corporation has co-developed with ERS Electronic […]

MPI Corporation Announced Successful Installation of the Next-Generation THZ Probe System at the Kollberg Laboratory of Chalmers University of Technology

Boosting Capabilities of Measurement Solutions for THz Frequencies with Unsurpassed
Measurement Dynamic Range, Calibration and Measurement Reproducibility

Taiwan, Oct. 6th, 2017 – MPI Corporation announced successful installation of the next-generation THZ probe system to the Kollberg Laboratory at Chalmers University of Technology, a leading research university located in Gothenburg, Sweden, […]

MPI Automated Systems Certified for IEC61010 and SEMI S2 Standards


Taiwan, August 17th, 2016 – MPI is proud to announce the successful completion of third-party conformity assessments (testing and certification) based on IEC 61010, EN ISO 12100 and SEMI S2 for all Advanced Semiconductor Tests (AST) automated probe systems. MPI has demonstrated clear leadership in recent years developing numerous and […]

MPI Corporation Announces Industry Acceptance of TS150-THZ Probe System

Taiwan, May 20th, 2016 – As a result of numerous orders corresponding with the growth of terahertz frequency range measurements in the wafer test market, MPI Corporation has received industry wide acceptance of the TS150-THZ probe station as the standard for these complicated high frequency measurements. The TS150-THZ addresses the […]

MPI Corporation Introduces a New Fully-Automatic Probe System for RF Production Test

Taiwan, May 6th, 2016 – As the 200 mm wafer test market continues to expand, MPI Corporation is introducing a new fully automatic wafer probe system. The TS2500-RF addresses multiple production test market requirements which include Radio Frequency (RF) communication devices and discrete passive components. The system is based on […]

MPI Corporation Supports National Chip Implementation Center with Donation of 200 mm Probe System to Endeavor Academia Development of IC’s

Taiwan, November 30th, 2015 – The world-leading Probe Card and Advanced Semiconductor Test Solutions provider, MPI Corporation, announced their commitment to support the National Chip Implementation Center (CIC), the leading laboratory and incubator under National Applied Research Laboratories (NARL) for IC/System design, research, and service in Taiwan. The commitment includes […]

R&S Demo MPI Wafer Testing System at EuMW 2015

MPI Corporation and Rohde & Schwarz Offer Joint Solutions for On-Wafer Measurements on Semiconductor Components

MPI Corporation and Rohde & Schwarz offer joint solutions for on-wafer measurements on semiconductor components
September 8, 2015

Taiwan, Hsinchu – MPI is partnering with the T&M equipment manufacturer Rohde & Schwarz to provide customers with turnkey solutions for measurements on semiconductor components in the RF and millimeter wave ranges. The two […]

The Future Starts Now – the New Automated Engineering Probe System

MPI Corporation announces its new Automated Engineering Probe System at IEEE MTT-S IMS 2015!

Measure the Difference

The TS2000-SE from MPI is the first ever 200mm automated engineering probe system on the market integrating innovative features specifically designed to reduce the cost of test:

  • Automated single wafer loader
  • Vertical control environment (VCE)
  • Hot/cold wafer swaps […]


MPI Corporation is proud to introduce the TITAN™ RF probes line. The TITAN ™ Probes provide the latest in technology and manufacturing advancements within the field of RF testing. They are T110derived from the technology transfer […]

MPI Corp. Acquires Key Technologies for Advanced Semiconductor Test

MPI Corporation has acquired all intellectual property and manufacturing expertise of Vector Semiconductor for product development and global distribution of MPI advanced semiconductor test engineering probing solutions outside Japan. Vector Semiconductor specializes in ultra-low-noise, waferlevel characterization of advanced semiconductor devices, integrated circuits and high-power devices in a thermal environment with […]

MPI Corp. Acquires Key RF Technologies for Advanced Semiconductor Test

MPI Corporation, the leader in advanced production semiconductor test solutions, has acquired Allstron Corporation. Allstron, headquartered in Taipei, is well known within the high frequency market for RF Probes and calibration substrates up to 110 GHz. This acquisition and infusion of technology has significantly reduced the time to market for […]